Scanning Electron Microscope features variable pressure mode.
Press Release Summary:
Featuring GEMINI® column and variable pressure technology, SIGMA VP FE-SEM is compatible with Carl Zeiss BSD and VPSE G3 detectors, which provide imaging of non-conducting specimens. Chamber includes provision for all WDS variants as well as geometry suitable for co-planar EDS and EBSD analysis. System control is by means of SmartSEM® software package with intuitive interface and GEMINI column.
Original Press Release:
Carl Zeiss Expands SIGMA FE-SEM Platform
Variable pressure mode extends analytical capabilities
CAMBRIDGE/UK, OBERKOCHEN/Germany, 08.07.2009.
Today, Carl Zeiss launches SIGMA VP, which adds variable pressure technology to the range of SIGMA field emission scanning electron microscopes (FE-SEM). Featuring the Carl Zeiss GEMINI® column, proven VP technology and a design with analytical accessories in mind, the SIGMA VP provides a comprehensive analytical solution for a constantly growing diversity of applications. The chamber includes the provision for all WDS variants as well as a geometry suitable for coplanar EDS and EBSD analysis. The SIGMA VP is compatible with a wealth of accessories including the Carl Zeiss BSD and VPSE G3 detectors, which provide exceptional imaging of non-conducting specimens.
The customer benefits of the SIGMA VP are a combination of outstanding flexibility and unrivalled ease of use with respect to both image acquisition and analytical applications. System control by means of SmartSEM®, the Carl Zeiss software package known for its intuitive interface, and the GEMINI column with user-friendly operation allow for excellent imaging by novices and experts alike.
With this launch Carl Zeiss further underlines its slogan: Maximum information - maximum insight.
Outstanding flexibility and unrivalled ease of use are the core benefits of the new SIGMA FE-SEM with variable pressure mode.
Markus Wiederspahn
Public Relations
Carl Zeiss SMT AG
Phone: +49 7364 20-2194
Fax: +49 7364 20-9206
E-Mail: wiederspahn@smt.zeiss.com
