Rudolph's Yield Management System Chosen for Manufacture of High Definition Displays in Mobile Devices
Genesis® Enterprise offline yield analysis and data management will be used to maximize factory efficiency and identify causes of yield loss
Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, FPD, LED and solar industries, announced today the sale of its Genesis Enterprise yield management software to a major manufacturer of high definition (HD) displays for hand-held devices. With consumer demand for higher resolution in smaller displays pushing critical dimensions toward the micrometer scale, display manufacturers are deriving large returns from the application of yield enhancement technologies developed in the semiconductor industry.
"Some HD displays for mobile devices now have more than 600 pixels per inch," said Len Labua, senior applications manager in Rudolph's Data Analysis and Review Business Unit. "Many of the processes used in their manufacture are similar to semiconductor processes, and at these sizes they are becoming vulnerable to similar types of defects and process variations. HD manufacturers are able to leverage yield management software developed largely for semiconductor manufacturing to achieve significant improvements in process yields. Not only do they get better performance from processes already in production, they can also ramp new processes to production yields faster."
Labua added, "This particular sale was to a company formed by a recent merger, and the purchase decision was based in part on previous experience with Genesis Enterprise software within the merged companies. The selection process involved a competitive evaluation, and it was the speed, reliability and ease of use of the software, combined with an established history of excellent support, that persuaded them to continue with Genesis in their newest facility."
Genesis Enterprise, an industry-leading solution with parametric yield management tools, allows manufacturers to identify domain-specific issues, such as spatial anomalies, processing sequence problems, commonality of effects, and systematic and random yield loss. Its data management and connectivity infrastructure assures easy, reliable integration of the Genesis software analysis and reporting platform with existing process tools and information systems, allowing process engineers and fab managers to quickly identify root causes of complex problems. With Genesis Enterprise software, manufacturers achieve greater profitability on products already in high-volume production and gain competitive advantage by quickly getting new products to market.
For more information about Rudolph's complete line of inspection, metrology and software solutions, please visit www.rudolphtech.com.
Rudolph Technologies, Inc. is a worldwide leader in the design, development, manufacture and support of defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers worldwide. Rudolph provides a full-fab solution through its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down the costs and time to market of their products. The company's yield management solutions are used in both the wafer processing and final manufacturing of ICs, as well as in emerging markets such as LED and Solar. Headquartered in Flanders, New Jersey, Rudolph supports its customers with a worldwide sales and service organization. Additional information can be found on the company's web site at www.rudolphtech.com.
Trade Press:
Virginia Becker
952.259.1647
virginia.becker@rudolphtech.com
