RF Test Cell System offers scalability to 128 RF ports.
Press Release Summary:
Featuring OPENSTAR®-compliant open architecture, T2000 SoC Test System consists of T2000 LS mainframe configured with 12 GHz RF monolithic module and integrated with M4841 Handler using parallel interface for quad-site parallel testing environment. Capable of testing 4 RF devices in parallel, air-cooled, quad-DUT module features 32 RF pins, each with access to VSG and VSA supporting 40 MHz of complex modulation bandwidth. Handler supports complex ICs in BGA, CSP, and QFP packaging.
Original Press Release:
Advantest Debuts Industry's First Fully Integrated 12 GHz Quad-Core Monolithic RF Module and Turnkey RF Test Cell Solution at Semicon West
Unparalleled flexibility provides lowest cost of ownership for multi-site production testing
SAN FRANCISCO, July 14 /-- Advantest Corporation , the world's leading supplier of semiconductor test equipment, is introducing its new 12GHz RF test cell solution at Semicon West and demonstrating a new 12GHz RF module for the T2000 open-architecture SoC test system. Advantest will exhibit its products and technology in West Hall booth 7447, on July 15 through 17, at San Francisco's Moscone Center. Advantest's new, powerful RF test cell consists of the T2000 LS mainframe configured with the new 12GHz RF module and integrated with the M4841 Handler, using a unique low noise parallel interface that offers the industry's only single-vendor, quad-site parallel testing environment.
The RF test cell solution from Advantest incorporates the ATE industry's first fully integrated 12 GHz quad-core monolithic test module. Currently capable of testing 4 RF devices in parallel, this air-cooled, parallel, quad-DUT module affords manufacturers an unmatched cost of test advantage. Furthermore, with 32 RF pins, each with access to high performance VSG and VSA supporting 40 MHz of complex modulation bandwidth, this module offers the industry's highest RF pin density for addressing multi-DUT, multi-band transceivers and Multiple Input Multiple Output (MIMO) device architectures. The tester and handler are integrated into a test cell with proprietary interface design that optimizes performance, maintainability, functionality and throughput for superior cost of ownership performance.
At Semicon, Advantest will demonstrate its multi-DUT RF solution enabling tools through a high-speed link with its Gunma facility, on a remote WiMAX quad-DUT device.
Turnkey RF test cell solution redefines "high-volume" manufacturing
Advantest's new RF test cell solution is unique for its single-vendor tester-handler integration, bringing a highly parallel, high-performance, turn-key manufacturing test solution to RF device manufacturing. The RF test cell solution has a number of uniquely optimized features that offer semiconductor designers, manufacturers and assembly-test companies high performance, high accuracy, and turn-key ease of use at low cost of test.
-- Highest density RF module instrumentation at 32-12GHz ports routed to 4-vectored sources and receivers allows dedicated resources to every complex RF SOC device pin.
-- Scalability to an unprecedented 128 RF ports and 16-vectored sources and receivers.
-- Multi-site innovation and patent pending RF shielding to improve yield.
-- 36 port quad-core RF simplifies correlation provides faster time to market.
-- Plug-n-Play high-performance site isolator module supports volume production.
-- ATE industry's first fully integrated 12 GHz quad-core monolithic RF module.
-- Optimized handler-tester connectivity for superb uptime, reliability and ease of use.
-- OPENSTAR(R)-compliant open test system architecture and the latest pick-and-place handler technology providing flexibility and scalability that leverage ATE investment while meeting the challenges of testing complex, sophisticated ICs.
-- An extremely compact ATE footprint, resulting in real estate and operating savings.
Tester/Handler Characteristics
OPENSTAR(R) compliant and designed for compactness and modularity, Advantest's T2000 LS mainframe is a low-cost test system for today's high-functionality SoC consumer devices. Demand is ongoing and growing for analog, digital and mixed signal devices that provide features and mobile communications for increasingly sophisticated consumer electronics as well as automotive, medical, transportation and other infrastructure applications. These highly sophisticated, densely designed integrated circuits (ICs) and the fast-paced, price-sensitive markets they target, require test solutions that meet their technical challenges as well as their cost challenges. Advantest designed the T2000 LSMF and its entire test cell solution to meet these needs.
The test head of the LS mainframe is designed to accommodate different modules for the varied applications needed to test complex SoCs. Offering high-speed analog, digital and RF test capability to perform highly parallel testing of complex SOC devices, Advantest's new solutions deliver significant cost reductions and a smaller footprint, together with greater performance and versatility.
Rounding out the test cell is Advantest's M4841 Dynamic Handler. Offering industry-leading high-throughput handling for volume testing of consumer devices such as MCUs and DSPs, the handler supports complex ICs and their advanced packaging technologies, including BGA, CSP and QFP. The M4841 is capable of parallel testing up to 16 devices and delivers a high throughput of 18,500 devices-per-hour.
About Advantest
Advantest Corporation is the world's leading supplier of automatic test equipment (ATE) to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at www.advantest.com.
CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, a.gold@advantest.com
Web site: www.advantest.com/
