Optical Microscope ensures accurate and repeatable data.

Press Release Summary:



Aurora-3(TM) Near-Field Scanning Optical Microscope (NSOM) offers tuning-fork technology, split light path, and open-architecture. It combines optical characterization with scanning probe microscopy (SPM) technology. Real-time linearized scanner provides accurate, one-step tip positioning. Optional atomic force microscopy capabilities are possible.



Original Press Release:


New Aurora System Updates NSOM Technology


Santa Barbara, CA, March 8, 2002 - Veeco Metrology Group has announced the release of the Aurora-3(tm) Near-Field Scanning Optical Microscope (NSOM), which significantly extends the capabilities of the standard - setting Aurora family of near-field microscopy systems. Digital Instruments Aurora-3, the most advanced NSOM platform available, combines industry-leading, patented tuning-fork technology with several new features to bring greater ease-of use to the researcher.

"The Aurora-3 makes alignment much easier because a split light path allows one to simultaneously view both transmission and reflection of the probe tip and sample," explains Stefan Kaemmer, NSOM project manager. "Its superior noise floor ensures that the additional data acquired is both accurate and repeatable. In addition, the system's open-architecture provides easy interfacing with detectors and spectrometers and its advanced software delivers experiment flexibility."

The Aurora-3 combines optical characterization with scanning probe microscopy (SPM) technology to overcome the diffraction limit of conventional optical equipment. A real-time linearized scanner provides accurate, one-step tip positioning, which is particularly important in such applications as single-molecule fluorescence. With its compatibility with the award winning Explorer SPM head, optional atomic force microscopy capabilities are also possible. Despite all of this, the Aurora-3 has a conveniently small footprint. These and the other ease-of-use features of the Aurora-3 will certainly bring the advantages of NSOM techniques to a greater number of general research studies.

Veeco Instruments Inc. (NASDAQ:VECO) is a worldwide leader in process equipment and metrology tools for the optical telecommunications/wireless, data storage, semiconductor and research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Arizona, and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan, and Asia Pacific. Additional information on Veeco can be found at www.veeco.com.

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