Press Release Summary:
- Allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons
- Can be used to create a library of EBSD patterns for all crystallographic orientations for a given material
- Capabilities include dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing
Original Press Release:
EDAX Launches New OIM Matrix™ Software Package for EBSD
MAHWAH, NJ, August 1, 2019 – AMETEK EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the OIM Matrix™ software package, which brings dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing capabilities to the EBSD market.
The OIM Matrix™ package allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons. This approach more accurately describes the behavior of the electron interactions within a sample and produces more realistic pattern simulations compared to traditional kinematic diffraction-based approaches. These simulated patterns can then be more easily and accurately compared with experimentally collected EBSD patterns.
OIM Matrix™ can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Experimental patterns can then be compared and matched with the best fitting pattern in the library, in an approach termed dictionary indexing. Dictionary indexing improves indexing success rates over standard Hough-based indexing approaches.
The OIM Matrix™ software is integrated into OIM Analysis™, which is the world-leading software platform for the analysis of EBSD data. This integration allows for the targeted application of dictionary indexing using the partitioning functionality within OIM Analysis™. This functionality adds another route to efficiently provide high-quality EBSD mapping data.
The simulated patterns provided by the OIM Matrix™ software can also be used to generate an optimized material file required to analyze different crystal structures. This automated optimization makes it easier for users to apply the EBSD technique to new materials and applications.
For further information, email EDAX at firstname.lastname@example.org.
EDAX is an acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of approximately $5 billion. For further information about EDAX, please contact:
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
E-mail: email@example.com Website: www.edax.com