Press Release Summary:
- Measures thickness of glass and film with a resolution of < 1 nm
- Generates small light spot diameter of 5 µm and tolerates material tilt angle of ± 4.5°
- Enables stable measurement results even on slightly curved surfaces
Original Press Release:
Precise Thickness Measurements of Flat Glass and Film
The IMP-TH70 sensor for the IMS5400 white light interferometer measures the thickness of glass and film with a resolution of < 1 nm. With 70 mm, this sensor offers a working distance of around twice as much as before, as well as a larger tilt angle. Passive cooling and active temperature compensation enable extremely stable measurement results in industrial environments.
The new IMP-TH70 sensor is now available for the interferoMETER IMS5400 from Micro-Epsilon. At 70 mm, it offers a working distance of almost twice as much as before. Furthermore, the new sensor generates a small light spot diameter of just 5 µm and tolerates a material tilt angle of ± 4.5°. This enables stable measurement results even on slightly curved surfaces.
The interferoMETER product group is the most precise, optical system available from Micro-Epsilon. The robust construction is designed for use in production lines. The innovative white light interferometers offer extensive connection options for optimal integration into various control systems and production programs.
These include digital interfaces such as Ethernet/EtherCAT as well as an analog output. The entire configuration of the controller and the sensors is carried out as usual via the web interface. It offers well-structured and simple setup and parameterization options.