Mixed-Signal Module enables testing of multi-channel SoCs.

Press Release Summary:

Featuring 16 channels and DSP-based architecture, Base Band Waveform Generator Digitizer Module satisfies diverse mixed-signal testing needs, including DC, audio, video, base band, and high frequencies on single board. Module offers 300 MHz undersampling BW and 16-bit performance. DUT independent triggering allows capturing fewer samples in asynchronous designs, while channel independent clocking allows parallel testing with multiple time domains per module.

Original Press Release:

Advantest Introduces 16-Channel Mixed-Signal Module for SoC Test; High Integration Dramatically Reduces Test Cost for Consumer IC's While Delivering Accuracy, Flexibility and High Performance

SAN FRANCISCO, July 11 / -- SEMICON West -- Advantest Corporation , the global leader in semiconductor test, today unveils a new cost-effective, high-performance 16-channel mixed-signal module that enables testing of multi-site, multi-channel SoCs used in applications such as mobile phones, set-top boxes, DVDs, WLAN baseband, DSL, cable modems, HDTV and video graphics. The product is making its debut at SEMICON West in San Francisco, California.

Designed with high integration, the Base Band Waveform Generator Digitizer (BBWGD) Module's 16 channels satisfy diverse mixed-signal testing needs -- such as DC, audio, video, base band, high frequencies -- on a single board. This density provides the industry's highest performance mixed-signal test module on the market for the lowest cost. In addition, the diverse functionality allows semiconductor manufacturers to realize higher utilization via fewer instruments; instead of separate audio, base band, and high speed modules, manufacturers can now streamline operations with one module. Advantest understands SoC customers' needs for efficient, cost effective test, as well as their need for high-parallelism and reliability to meet the challenges of the rapidly changing consumer products IC market.

The Leader in Filling Customers' SoC Test Needs
The BBWGD module further optimizes the benefits of Advantest's T2000 Open Architecture Test Platform. The T2000 is the industry's only test platform based on OPENSTAR(R) open architecture specifications introduced by the not- for-profit Semiconductor Test Consortium. OPENSTAR(R) is a truly open, non- proprietary architecture -- that is, its specifications are open to the public and to all developers. The adaptability and interoperability of the T2000 make it ideally suited to the demands of SoC test and, in fact, industry acceptance of the T2000 has propelled Advantest to the leadership position in the SoC test market.

Tom Brennan, product engineer for the BBWGD module, says, "Advantest is unique in offering this high-density, high-performance, and wide bandwidth in a low cost module. Other modules may have some features of Advantest's BBWGD, but no other module delivers this magnitude of performance and density at this price point per channel. The combination of the T2000 with our new BBWGD module gives semiconductor manufacturers a terrific competitive advantage."

R. Keith Lee, president and CEO of Advantest America, adds, "Advantest understands the cost, time and functionality challenges that semiconductor manufacturers face, and our new BBWGD module is the latest example of how Advantest focuses on customers' issues and develops the solution they need. Advantest's reputation in providing high performance test solutions is demonstrated once again by this new test instrument module, and it's a testament to our engineers that they've achieved such a high level of integration on a single module."

Benefits of Standard-setting Engineering

Customers can realize a number of benefits from the salient design features of Advantest's new 16-channel mixed-signal module:

o Single instrument AWG/DIG solution: High 300MHz undersampling BW & high 16bit performance (THD <-80dBc) supports a variety of applications and results in higher utilization, fewer ATE configuration complexities, broader test coverage and faster test times from less averaging. High density >2GHz BW path to loadboard enables excellent gain/phase linearity and IQ pair matching.

o 8 differential 400Msps AWG's + 8 differential 128Msps Digitizer's enable x4 DUT baseband testing per module.

o DSP based architecture: Offers higher integration, higher performance, lower cost, simplified calibration, and proprietary I & Q channel amp/phase matching. Higher performance means fewer samples, higher yields, and faster test times. Local DSP hardware engine per baseband digitizer minimizes DUT test times by avoiding transfer and central processing of samples.

o Multi-DUT triggering: DUT independent triggering allows capturing fewer samples in today's asynchronous designs by focusing on when the DUT is ready rather than on when the tester is ready.

o Multiple Clock Domains: Channel independent clocking allows parallel testing with multiple time domains per module. This feature eliminates the need for test serialization thus providing quicker test times.

o Pattern burst/continue mode: Faster testing of multiple analog waveforms triggered from digital, DUT, or other instruments.

o Built in PMU & calibration: Internal AWG to DIG loopback, internal 6.5 digit DVM access, and PPMU simplifies load board and maintains calibrated performance to DUT.

Advantest is currently taking orders for the 16-channel BBWGD module, which will be available September 2006. Pricing starts at under $50,000.

About Advantest
Advantest Corporation is the world's leading supplier of automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at www.advantest.com/.

CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, a.gold@advantest.com

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