MEMS Test Cell provides tri-temp device testing.
Press Release Summary:
With temperature range of -55 to +180°C, MEMS Test Cell integrates pick and place handler, MEMS tester, physical stimulus, tri-temp option, and sockets. Nitrogenless, chamberless test cell keeps same productivity of ambient conditions up to 12.000 UPH for all temperature options, while deleting risks of humidity presence in test area. Devices are stimulated at above temperature conditions so that complete parametric and functional test is performed in short time.
Original Press Release:
High-Throughput Tri-Temp MEMS Test Cell
SPEA announces the launch of the first test cell for the tri-temp test of high-production MEMS devices, with a temperature range of -55°C - +180°C.
This single-manufacturer, complete solution integrates pick&place handler, MEMS tester, physical stimulus for functional MEMS test, tri-temp option, and sockets.
The innovative nitrogenless, chamberless SPEA tri-temp test cell keeps the same productivity of the ambient conditions (up to 12.000 UPH) for all the temperature options, while deleting all the risks of humidity presence in the test area.
The devices are stimulated (through acceleration, angular, magnetic, pressure stimuli, etc) at the above temperature conditions, so that a complete parametric and functional test is performed in short time, significantly lowering the overall cost of test.
