Memory Test System offers 768 DUT parallel test capacity.
Press Release Summary:
Along with 533 Mbps capability, T5385 delivers flexible pin configuration that supports diverse DRAM devices. Tester pin resources can be optimally allocated for efficiency, reduced touchdowns, and improved throughput. Solution also delivers Known Good Die (KGD) for consumer devices, promoting yields for low power DDR2 (LPDDR2) and DDR3 multi-die and stacked devices. Also, high-speed memory repair analysis system is included for DRAM and Flash memory wafer test.
Original Press Release:
Advantest's New T5385 DRAM Wafer Test System Offers Industry-Best 768-DUT Parallel Test Capacity
Flexible pin configuration supports diverse DRAMs and improves throughput
SANTA CLARA, Calif., July 28 -- Advantest Corporation today announced availability of its new T5385 memory test system for dynamic random access memory (DRAM) wafer test, offering a parallel test capability of 768 devices -- the highest in the industry, and twice the capability of the company's previous model. The T5385 will be available beginning August 2009.
Demands at wafer level test continue to increase for both improved performance and a lowered cost-of-test. Advantest's new T5385 addresses these issues and improves efficiency per device while scaling even higher in parallelism. The T5385 not only boasts an unrivaled 768-DUT parallel test capacity, but also delivers 533Mbps capability for increased throughput and lowered test costs, making it an ideal solution for high-volume wafer fabs. The new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, and allows tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. The T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for tomorrow's Low Power DDR2 (LPDDR2) and DDR3 multi-die and stacked devices. Enabled by hardware and software advances, the T5385 offers a high-speed memory repair analysis (MRA) system for DRAM and Flash memory wafer test that greatly reduces test time.
-- New Tester Improves Throughput in Wafer Test Process
DRAM memory chips used in today's computers and other electronics deliver faster processing speeds, higher data storage volumes, and more efficient power consumption than previous generation devices. To enable these gains, the semiconductor industry is aggressively migrating to smaller process nodes that allow more chips and greater densities to be produced from each wafer. Throughput has therefore become a critical issue in DRAM wafer test, with chipmakers demanding significant gains to increase productivity. Advantest's new T5385 delivers an unrivalled parallel test capability and flexible pin configurations that significantly improve throughput in the wafer test process.
-- Features and Benefits
(1) Industry's highest DRAM wafer test parallel capability of 768 devices
The T5385 boasts a parallel test capability of 768 devices -- twice that of Advantest's previous model, the T5383, and the highest in the industry. Massively parallel testing reduces touchdowns and helps to lower test costs significantly in high-volume wafer fabs. The new tester is also equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for greater efficiency.
(2) High-Speed MRA
Enabled by hardware and software advances, the T5385 offers a high-speed MRA (Memory Repair Analyzer) for DRAM and flash memory wafer test that reduces test time by 30%, compared to the previous model.
(3) Reinforced Flash Memory Test Capability
The T5385 also supports flash memory wafer test. It boasts a proprietary tester-per-site architecture optimized for flash memory, contributing to reduced test times.
(4) T5385ES Memory Test System for DRAM R&D Also Available
Designed for engineering use, the smaller T5385ES offers all the functional and performance qualities of the T5385. Engineers can easily perform evaluation and characterization, and test programs developed on the T5385ES can be seamlessly transferred to the T5385, accelerating DRAM development processes.
With the announcement of the T5385ES and T5385 test systems, covering DRAM and flash memory wafer test from development to high-volume production, Advantest again affirms its commitment to providing best-in-class test solutions.
Key Specifications:
Target Test Devices: DDR3 / DDR2-SDRAM, NAND / NOR Flash memory, etc.
Parallel Test Capacity: T5385: 768 (x 4 I/O channels)
T5385ES: 12 (x 4 I/O channels)
Maximum Test Speed: 266MHz / 533Mbps
About Advantest
Advantest Corporation is the world's leading automatic test equipment supplier to the semiconductor industry, and also produces electronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA, Advantest Europe GmbH is based in Munich, Germany, and Advantest Taiwan Inc. is based in Hsinchu, Taiwan. More information is available at www.advantest.com
CONTACT: Amy Gold, Advantest America, Inc., +1-212-850-6670, a.gold@advantest.com
