Measuring System offers nanometric resolution.
Press Release Summary:
Form Talysurf PGI 1240 delivers 0.8 nm resolution over 12.5 mm seamless measuring range, delivering ability to measure form, roughness, radius, inclination, and contour in one traverse. System utilizes Phase Grating Interferometry and has 200 mm horizontal measuring traverse and 450 mm vertical positioning traverse. Additional offerings include 0.125 µm horizontal data spacing, selectable traverse speed down to 0.1 mm/sec, and dedicated aspherics analysis software.
Original Press Release:
Contour and Form Analysis with Nanometric Resolution
The all new Form Talysurf PGI 1240 delivers 0.8nm resolution over 12.5mm range for an unprecedented ability to measure form, roughness, radius, inclination and contour in a single traverse. Phase Grating Interferometry (PGI) advances the science of contact measurement technology and is ideal for high precision, optical grade components, many of which have form accuracies specified as fractions of a wavelength.
Because the 12.5mm measuring range is seamless, not smaller increments stitched together via software, it is possible to calibrate the system using a high precision, optical quality sphere. This method of calibration, patented by Taylor Hobson, is a true system calibration. It checks gauge linearity over the entire 12.5mm range and ensures that the stylus tip radius is correct through all points of contact with curved or inclined features on a component.
With 200mm horizontal measuring traverse and 450mm vertical positioning traverse, the Form Talysurf PGI 1240 can accommodate extremely large components. At the same time, it is well suited for miniaturized components thanks to 0.125um horizontal data spacing and traverse speed selectable down to 0.1mm/second. Programmed, automatic measuring and analysis routines assure maximum productivity for all applications.
Specifications never seen before in this type of measuring device abound in the Form Talysurf PGI 1240. Residual system noise is less than 1nm RMS; Z axis repeatability is 25nm; Z axis non-linearity is 70nm; horizontal traverse straightness is 100nm over the full 200mm length. The system operates on a stable foundation complete with pneumatic anti-vibration pads and composite granite construction for ultimate stiffness throughout the measuring loop.
To assure stability and nanometric measuring capability regardless of where the instrument is located, it includes a "Nano-Trap" environmental enclosure. Clear polycarbonate panels set in a rigid aluminum frame completely surround the measuring station to suppress ambient noise, air currents or temperature fluctuations. Sliding panels front and rear of the "Nano-Trap" provide access for loading components.
For use within the precision optics industry, Form Talysurf PGI 1240 has dedicated aspherics analysis software which includes SAG tables, profile comparison and radius optimization. Also, a new series of stylus arms and stylus tips has been developed for use with sensitive materials and finely polished surfaces. The new stylus designs expand the scope of the system to film thickness checking and verification of diamond turning systems.
For further information contact
Tom Brem
Communications Manager
847-290-8090
tbrem@taylorhobson.us
Phil Lockhart
National Sales Manager
847-290-8090
plockhart@taylorhobson.us
