Press Release Summary:
IL Integrating Sphere and RPS Series Spectroradiometer measure total flux, dominant wavelength, chromaticity, color purity, and photopic response of LEDs and small lamps in controlled environment with NIST traceable results. WindowsÃ‚Â® compatible software can display CIE chromaticity diagram on laptop and performs color repeatability and brightness sampling with 5-10 nm resolution in less than 1 min.
Original Press Release:
LED Characterization System Measures Total Integrated Output
A new integrating sphere and portable spectroradiometer system that can perform NIST traceable measurements of LEDs and other small lamps is being introduced by International Light, Inc. of Newburyport, Massachusetts.
The IL Integrating Sphere and RPS Series Spectroradiometer are capable of measuring total flux, dominant wavelength, chromaticity, color purity, and photopic response in a controlled environment with NIST traceable results. Featuring WindowsÂ® compatible software that can display a CIE chromaticity diagram on a laptop, this compact system performs color repeatability and brightness sampling with 5nm to 10nm resolution in less than one minute.
Providing a 10" integrating sphere with a white barium sulfate coating and NIST traceable standard lamp, packaged in the 14.4" cube, this LED characterization system can be equipped with an RPS 200 Spectroradiometer which is UV optimized for taking measurements from 200nm to 440nm or the RPS 380 model for taking visible measurements from 380nm to 780nm.
The IL Integrating Sphere and RPS 380 Spectroradiometer is system priced at $9,695.00 and is the most cost-effective LED characterization system on the market today, claims the firm. Literature is available upon request.
For more information contact:
International Light, Inc.
Roy E. Grayzel, VP Sales & Marketing
17 Graf Rd.
Newburyport, MA 01950
(978) 465-5923 FAX (978) 462-0759