Laser Microscope provides sub-micron imaging.

Press Release Summary:



Featuring 408 nm laser, LEXT Confocal Laser Scanning Microscope offers 120-14,400 x magnification power, 0.12 mm resolution, and 3D measurement capability. Unit simultaneously images samples in 3D and true color by combining acquired laser 3D image with full color brightfield image in system computer. Samples can be placed directly onto LEXT stage and imaged without preparation or sample destruction. Measurement repeatability is within 0.020 mm.



Original Press Release:



Olympus Introduces New Advanced Confocal Laser Microscope



“See in a whole new light”

Olympus Industrial America has launched LEXT, a new Confocal Laser Scanning Microscope designed for sub-micron imaging, with outstanding 0.12mm resolution and accurate three-dimensional measurement capability. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMS).

LEXT combines a 408nm laser with optics specifically designed for operation at this wavelength to optimize image quality and limit aberrations. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution.

Brightfield, Darkfield and Differential Interference Contrast (DIC) Microscopy techniques are possible in both video and laser confocal imaging modes. The new confocal laser DIC mode is especially useful for highlighting subtle textural variations during surface analysis.

For the first time, LEXT also offers the ability to simultaneously image samples in 3 dimensions and "true color" by combining the acquired laser 3D image with the full color brightfield image in the system computer, useful when observing a colored sample such as a CCD.

This new technology is ideally suited to the manufacture of high tolerance components, including MEMS, automotive parts, ceramics, plastics and metals. For quality assurance purposes, roughness analysis, height measurement and volumetric analysis are all easily achieved. Failure analysis is also well served by the capabilities of the LEXT system where fast, reliable high resolution measurements can be obtained with ease.

Unlike SEM or AFM, samples can be placed directly onto the LEXT stage and imaged without time-consuming preparation or sample destruction. Facility requirements are also minimal, as there is no need for a vacuum chamber.

LEXT goes beyond conventional microscopy and has been designed as a 3D metrology tool. The strong frame and special stage minimize the transmission of vibration into the unit, which can otherwise interfere with, and degrade, measurement accuracy. The choice of a small solid-state laser also contains the ‘footprint’ to within just 464mm wide x 560mm deep, providing system portability and low running costs. Measurement repeatability is within 0.020mm (3 sigma), with z-axis repeatability within 0.052mm (3 sigma).

Key to the system' ability to achieve clear focus in 3D is the calculated focus operation (CFO). Ordinarily, confocal laser scanning microscopes acquire 3D images by stacking multiple image planes taken from the scanning of a component throughout its height at regular sub-micron steps. LEXT uses an intelligent software drive, which selects only the best focal planes to form the sample. This feature not only speeds the operation, but also ensures the best focal fit for each one of the selected planes, resulting in a better final image.

This new tool offers high-resolution metrology in all three axes with measuring accuracy not limited to height profilometry. Matched with outstanding color imaging, Olympus is confident that this instrument will be highly competitive in serving many existing and emerging applications in the nanotechnology market.

Olympus Industrial America provides sales & support for the complete range of Olympus microscope products and accessories for industrial applications throughout the USA and Canada. The company's products include:
o Stereo microscopes
o Upright compound microscopes
o Inverted metallographs
o Measuring microscopes
o Semiconductor microscopes
o Laser scanning confocal microscopes
o Image analysis software
o High speed video systems
o Industrial endoscopes for remote visual inspection

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