Keysight Technologies will demonstrate its latest EMC, power integrity and signal integrity solutions at EMC 2016—IEEE international symposium on electromagnetic compatibility.
Keysight will have design and test experts specializing in the areas of electromagnetic interference compliance, power integrity, signal integrity and more, available in its booth.
Discussions and demonstrations will include:
Standards compliant EMI measurements to 44Ghz and higher with signal analyzer based diagnostics
EMC precompliance measurement and diagnostic evaluation tools
Signal and power integrity solutions, including SIPro and PIPro EM analysis solutions for ADS 2016
Physical Layer Test Systems (PLTS) that support the flexible PXIe chassis form factor
Power distribution networks (PDN) component characterization with the ENA network analyzer
RF microwave handheld network and spectrum analyzers
Power integrity measurements using an oscilloscope
Heidi Barnes, senior applications engineer, Keysight, will present at the “Development Activities for IEEE P370 Standard – Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz” workshop, scheduled for the morning of July 25. Barnes will also participate on a panel sponsored by TC10 and in the Task Group 1 activities, which are focused on test-fixture design criteria.
Additional information about EMC 2016 is available at www.emc2016.emcss.org.
EMC 2016, Shaw Center, Booth 608, Ottawa, Ontario
Additional Information: www.keysight.com/find/EMC
Additional information about Keysight Technologies is available in the newsroom at www.keysight.com/go/news.
Janet Smith, Americas
Sarah Calnan, Europe
+44 (118) 927 5101
Connie Wong, Asia