Imaging System measures stress in various materials.
Share:
Press Release Summary:
Designed to measure retardance and slow-axis orientation of 40 x 30 mm sample in under 3 sec, LC-PolScope System analyzes low-level birefringence in samples with 0.02 retardance magnitude (nm) sensitivity. It utilizes liquid crystal optics and proprietary algorithms, automating process of quantitative birefringence metrology. This allows users to accurately calculate retardance magnitude and orientation at every pixel within seconds.
Original Press Release:
The CRI LC-PolScope(TM) MACRO Imaging System
Woburn, MA - June 9, 2004 - Designed to measure retardance and slow-axis orientation of a 40x30mm sample in under 3 seconds. Data include retardance magnitude (nm) and slow-axis orientation per pixel of a megapixel CCD image. The LC-PolScope System provides a unique method to measure and analyze low-level birefringence in samples with a sensitivity of 0.02 nm. Traditional methods for measuring the spatial distribution of birefringence with polarized light are cumbersome and time intensive. LC-PolScope technology automates the process of quantitative birefringence metrology, allowing you to accurately calculate retardance magnitude and orientation at every pixel within seconds. Measure stress in glass, glass-to-metal interfaces, optical materials, discs, thin films, polymers, fibers, biological specimens, and more. Microscopic system is also available.
The LC-PolScope technology relies on CRI's patented liquid crystal optics and fast proprietary algorithms. The software incorporates an easy-to-follow interface for capturing and analyzing images, which are archived in digital form for accurate viewing, analysis and easy export.
