HMX Handheld XRF Tool for Point of Process Metal Film Thickness and Composition Measurement
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HOLBROOK, NY, - December, 2006 - Matrix Metrologies, Inc., a supplier of film measurement and WEEH/RoHS verification equipment, introduces a new XRF Film thickness measurement tool.
System HMX, is the world's first handheld XRF film thickness and composition analysis tool. The New HMX allows the user to take the Lab to the process by delivering the speed, power and precision of XRF analysis, wherever and whenever it is needed. The HMX is an XRF solution for measurement of large (even giant) samples. It provides at-process measurement for QC, plating line, and analysis lab applications and at-sample analysis in the factory or in the field along with alloy sorting and alloy identification for substrate materials management. In addition the HMX's Unique "Batch Measurement" mode lets you calculate the average thickness of a batch of small parts with a single measurement. Simply "point and shoot" and the analyzer automatically generates an average thickness for the entire lot.
The XMH Handheld XRF is part of Matrix Metrologies complete family of x-ray fluorescence thickness and composition and WEEH/RoHS compliance measurement tools.
Matrix Metrologies, headquartered in Holbrook, New York offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.
Additional information on Matrix Metrologies, Inc. can be found at www.matrixmetrologies.com. Or info@matrixmetrologies.com
