Geotest Expands Capabilities and Performance of Digital I/O Cards
Irvine, Calif. (September 2, 2009) - In a move to broaden capability and performance in its line of 3U PXI dynamic digital I/O cards, Geotest has enhanced the features and vector load/unload performance for its current series of digital instrumentation.
The vector load/unload times of the enhanced GX5280 and GX5290 series now require less than half the time required by other competitive products - providing the industry's fastest performance PXI digital instrumentation and resulting in reduced test execution times and faster throughput for digital test applications.
"In addition to improving vector data load/unload performance, we have also incorporated real-time compare into our GX5290 series instruments, providing users with a fast test method for testing digital devices which require deep test vectors," said David Manor, vice president of Geotest. "These latest enhancements to our digital product line underscore Geotest's commitment to developing digital products that offer the best value and performance in the industry."
To support these new features, current GX5280 and GX5290 products can be field-upgraded by uploading and installing new firmware. A new DIO driver support package is also available for these products.
About Geotest - A subsidiary of the Marvin Group, Geotest - Marvin Test Systems, Inc. is a global supplier of PXI and PC-based test products, systems, and solutions. Geotest's products and systems are used worldwide in thousands of aerospace, semiconductors, communications, medical, industrial, and military test applications.
For More Information:
To receive information about Geotest or Digital I/O cards contact Geotest at:
Telephone: 888.837.8297
949.263.2222
Fax: 949.263.1203
E-mail: info@geotestinc.com
Internet: www.geotestinc.com
Address: 1770 Kettering
Irvine, CA 92614
Anthony Nardone
(949) 263-2222
anthonyn@geotestinc.com
For Reader Inquiries: 888.837.8297
