FT/IR Spectrometers are based on corner-cube interferometer.

Press Release Summary:




Series FT/IR-4000 and FT/IR-6000 feature AccuTrac(TM) DSP minor tracking systems that guarantee reproducibility of interferometer mirror velocity and position, resulting in high signal-to-noise ratio. Quick Start System offers pushbutton sample measurement and data processing functions. Models FT/IR-4100 and FT/IR-4200 can be upgraded to meet requirements as needed, while Model FT/IR-6300 offers rapid scan capability for real-time analysis of reaction kinetics.



Original Press Release:



New Series of FT/IR Spectrometers with the Highest Signal-To-Noise Ratio



The new Jasco FT/IR-4000 and FT/IR-6000 series of instruments set a whole new standard for performance, flexibility, and ease of operation. Based on a highly stable corner-cube interferometer, the innovative technology incorporated in the AccuTrac(TM) DSP minor tracking system guarantees exceptional reproducibility of interferometer mirror velocity and position resulting in an exceptionally high signal-to-noise ratio. The Quick Start System offers sample measurement and data processing functions with a simple push of a button. An auto-alignment function ensures optimal instrument performance after changing optical components or after an instrument relocation, while the Baseplate Purge(TM) System or a total vacuum option ensures greater sensitivity across all spectral ranges.

The new FT/IR-4100 and FT/IR-4200 were designed to provide operational features and sensitivity levels found only in more expensive instruments. Each instrument can be easily upgraded to meet new requirements as needed including addition of an MCT detector, or microanalysis with the IRT-3000 FT-IR microscope, or even infrared imaging with the IMV-4000 multi-channel microscope.

The new Jasco FT/IR-6100, FT/IR-6200, and FT/IR-6300 offer the highest level of performance for a wide range of critical research and development applications with measurements from the near to the far infrared regions. The FT/IR-6300, which boasts the industry's highest signal-to-noise ratio, is equipped with a rapid scan capability for real time analysis of reaction kinetics. For faster time-resolved infrared measurements, a Step Scan option is also available for all three models. Interfaced with the IMV-4000 multi-channel infrared microscope, the FT/IR-6000 series offers advanced capabilities for dynamic process analysis including dynamic imaging experiments.

For more information call 800-333-5272, FAX: 410-822-7526, visit our web site at www.jascoinc.com or e-mail: inbox@jascoinc.com.

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