Force Sensor enables laser-less nanoscale imaging.
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Press Release Summary:
Negating complexity/difficulty issues associated with atomic force microscopes, Crystal Scanner(TM) minimizes operator interaction, reducing potential for errors in measurement. Force sensor consists of crystal oscillator with sharp probe mounted at end of crystal to scan surface of sample. Compatible with proprietary scanning probe microscopes, option uses Point and Scan(TM) Technology with on-screen video tutorials and standard sample menus.
Original Press Release:
Pacific Nanotechnology Announces Launch of the Crystal Scanner(TM) for its Microscope Products Enabling Routine and Robust Nanoscale Imaging Applications
(August 1st, 2004 Santa Clara, CA) --.Pacific Nanotechnology. Inc. (PNI) announces the introduction of the Crystal Scanner(TM), a revolutionary approach to nanoscale imaging without the complexity and difficulties associated with atomic force microscopes. This exciting option is compatible with PNI's family of scanning probe microscopes (SPMs).
There is no laser associated with the Crystal Scanner(TM), which means there is no light-lever mechanism for adjustment, giving users a completely new approach to nanoscale imaging.
The Crystal Scanner(TM) uses a new type of force sensor. This is a small crystal oscillator that has a sharp probe mounted at the end of the crystal to scan the surface of the sample. With no laser, this makes operator interaction minimal, reducing the potential for errors in measurement and making routine imaging available to all potential users.
No longer will it be necessary to have highly skilled operators to set up, run and interpret data. With the versatile Crystal Scan Software, users can rapidly learn how to use the microscope through on-screen video tutorials and have standard sample menus available to reduce operation to a simple method: Point and Scan(TM) Technology.
Whether users are in an academic research environment or in an industrial analysis laboratory, today's demand is for routine nanoscale measurements with a key driving requirement for today's imaging tool being to provide results faster with minimal time required to learn the technique. Analogous to the routine use of an SEM, Crystal Force Microscopy (CFM) provides this with an instrument for table-top metrology and imaging available for everybody at an affordable price.
In announcing PNI's Crystal Scanner(TM) option, Chief Technical Officer, Dr. Paul West, said "The very strong value proposition of Crystal Force Microscopy is that as there is no need to employ a highly skilled specialist to run it, the instrument price is the major expense and thus users will see a rapid return on their investment."
More details can be found at PNI's web site: pacificnano.com.
Pacific Nanotechnology, Inc. is the only applications-oriented solution provider in the world of the nanometer: PNI designs, develops, manufactures and supplies products and services to the fields of nanotechnology and nanoscience. There is a broad customer base: In academic research where the goal is to advance the frontiers of knowledge where nanoscale characterization and measurements are critical. And to industrial customers where in the development of new products, there is a need to be visualize and measure nanometer scale dimensions and in manufacturing where there is the need to control processes for products that have tolerances in the nanometer size range.
Visit pacificnano.com to learn more about PNI's philosophy, products and services.
