FEI's Titan(TM) S/TEM Receives Industry Honors
HILLSBORO, Ore., Jan. 31/ -- Within months of its release, FEI's Titan(TM) scanning transmission electron microscope (S/TEM), the world's most powerful, commercially-available microscope, has earned four prestigious awards for its design, performance and innovation. Awards include the coveted iF Design Award bestowed by the International Design Forum (iF) in Hannover, Germany, and the Innovative Product of the Year Award presented by the Oregon Tech Awards in the United States. The Titan S/TEM was also selected by editorial boards as one of the Top Products of 2005 by Solid State Technology magazine and one of the Greatest Hits of 2005 by MICRO magazine.
Known throughout the world as one of the most prestigious distinctions for manufacturers, the iF Product Design Award is presented in recognition of superior product design. Like the IDEA (Industrial Design Excellence Awards) in the United States, the iF awards represent the best product design in Europe. Winning products are selected from more than 2000 entrants in more than 30 countries and are judged on several levels, including design quality, material compatibility, innovation, environmental consideration, convenience, stability and durability. The industrial design of the Titan S/TEM was developed for FEI by Philips Design.
"We are extremely honored to receive these recognitions from the industry," said George D. Scholes, FEI's vice president who led FEI's TEM business. "The Titan's sub-Angstrom resolution, high stability, reliability and overall ease-of-use have set a new standard for aberration-corrected S/TEM imaging, and customer reaction to the Titan has been very favorable. Its performance and flexibility are designed to meet the ultra-high resolution requirements for our customers working in NanoResearch and Industry, and NanoElectronics for many years to come. The new platform also holds promise for the growing number of advanced application in NanoBiology and pharmaceutical development."
The Titan microscope enables deep sub-Angstrom resolution making way for the highest performance available in both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) modes. The import of ultra-high resolution imaging continues to grow as advanced research work continues deep into the nanoscale, semiconductor manufacturers push beyond the 45 nm node for design and manufacturing, and government regulatory agencies around the world see a growing need to characterize the smallest of nano-particles.
The first Titan S/TEMs were installed in the second half of 2005. Additional installations are currently underway around the world and FEI is increasing production to keep up with demand.
About the iF Design Awards
The iF Design Awards, which were established in 1954, are supervised by the International Design Forum (iF) in Hannover, Germany. iF has acquired an international reputation as a leading industrial design institution. iF is committed to supporting the cause of industrial design and raising awareness among industrial decision-makers on the crucial impact that design can have on successful product marketing. For additional information on the iF awards, please visit www.ifdesign.de/ .
About FEI
FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the sub-Angstrom level. With R&D centers in North America and Europe and sales and service operations in more than 40 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of this century into reality. More information can be found on the FEI Web site at: www.feicompany.com/ .
CONTACT: Dan Zenka, APR, Director, Worldwide Public Relations of FEI
Company, +1-503-726-2695, or dzenka@feico.com
Web site: www.feicompany.com/
http://www.ifdesign.de/
