FE-SEM System features integrated EDS capabilities.

Press Release Summary:

With integrated silicon-drift X-ray detector, digital multichannel analyzer, and intuitive software, Model 8500B allows users to perform quantitative elemental analysis on arbitrary points, on continuous line scan, or in user-defined regional map. Energy Dispersive Spectroscopy results are analyzed and displayed in real-time and researchers can export data for further off-line analysis. Patented event-streamed spectrum imaging saves full spectrum at every pixel for analysis and display.

Original Press Release:

Keysight Technologies Adds Fully Integrated EDS Capabilities to Low-Voltage, High-Resolution FE-SEM System

SANTA ROSA, Calif., – Keysight Technologies, Inc. (NYSE: KEYS) today announced the immediate availability of its newest field-emission scanning electron microscope (FE-SEM), the 8500B. The technologically advanced Keysight 8500B offers scientists the analytical power of energy dispersive spectroscopy (EDS), fully integrated within a remarkably compact, low-voltage FE-SEM.

Keysight designed this easy-to-install, plug-and-play FE-SEM for use in practically any lab and requires only an AC power outlet. The compact 8500B delivers outstanding image resolution rivaling that of much larger and more expensive FE-SEMs.

The new 8500B system's fully integrated silicon-drift x-ray detector, digital multichannel analyzer and intuitive software interface put EDS capabilities at researchers' fingertips, allowing them to perform quantitative elemental analysis on arbitrary points, on a continuous line scan or in a user-defined regional map. The Keysight 8500B is capable of detecting elements as light as carbon, up to americium.

EDS results are analyzed and displayed in real time and researchers can export the data for further off-line analysis. Keysight's patented event-streamed spectrum imaging saves the full spectrum at every pixel for analysis and display. Dynamic element mapping allows real-time selection or editing of elements and processing parameters during spectrum image collection.

The 8500B also offers several low-voltage imaging techniques for enhancing surface contrast and allowing the observation of nanoscale features on a wide variety of nanostructured materials, including polymers, thin films, biomaterials, and other energy-sensitive samples on any substrate, even glass. A novel, compact electrostatic lens and electron beam column design helps guarantee consistent, replicable performance without constant re-tuning of the column.

In addition, continuously variable beam energy optimized for low-voltage operation minimizes the need to conductively coat samples when using the Keysight 8500B FE-SEM. A software-controlled, programmable X/Y/Z stage enables simple sample navigation.

Keysight 8500B images are available at www.keysight.com/find/8500_images. Additional FE-SEM research images www.keysight.com/find/fe-sem.

About Keysight Technologies

Keysight Technologies (NYSE:KEYS) is a global electronic measurement technology and market leader helping to transform its customers' measurement experience through innovations in wireless, modular, and software solutions. Keysight's electronic measurement instruments, systems, software and services are used in the design, development, manufacture, installation, deployment and operation of electronic equipment. The business had revenues of $2.9 billion in fiscal year 2014. Information about Keysight is available at www.keysight.com.


Janet Smith, Americas

+1 970 679 5397


Twitter: @KeysightJSmith

Sarah Calnan, Europe

+44 (118) 927 5101


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