EDAX Launches Apollo SDD

Next Generation Silicon Drift Detector Revolutionizes X-ray Microanalysis

MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Apollo Series SDD, the next generation of silicon drift detectors for X-ray microanalysis.

"The development of our Apollo Series SDD revolutionizes the X-ray microanalysis market. The Apollo Series offers a range of detector sizes including a large-area SDD chip, but just as importantly, the positioning of the detectors close to the sample is very similar to that of the best-designed 10mm² Si(Li) detectors. The largest of the detectors provides a collection efficiency over three times that of the Si(Li) detector," explains Del Redfern, Product Marketing Manager for EDAX.

"The great promise of the SDD was to enable high-input count rates with excellent energy resolution to be collected by a liquid-nitrogen-free EDS detector. Unfortunately, the early generation of SDD chips had problems with energy resolution and peak stability at high count rates. Even after these issues were addressed, the size of the chip negated the possibility of collecting high-input count rates," notes Redfern.

"Now, by incorporating the next generation SDD chip into the Apollo SDD, we can fulfill the early promises of SDD by collecting X-ray maps in seconds without resolution degradation and peak shift over the dynamic range of the detector," he adds.

"The Apollo Series SDD, is the perfect complement to our market-leading Genesis software, bringing all the advanced features for qualitative and quantitative analysis, mapping and particle analysis to the materials characterization scientist. The Apollo Series SDD fits seamlessly into the EDAX family of materials characterization tools, effortlessly integrating with our market-leading EBSD cameras and our technology leading WDS systems," continues Redfern.

"Finally, users have an SDD that fulfills the promise," concludes Redfern.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron BackScatter Diffraction instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of more than $1.8 billion.

For further information about EDAX/TSL, contact us at:

91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 o Fax: (201) 529-3156
E-mail: info.edax@ametek.com

Website: www.edax.com

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