Dynamic Test Handler offers volume testing of MCUs and DSPs.
Press Release Summary:
Supporting BGA, CSP, and QFP packages, Model M4841 provides maximum parallel test capacity of 16 devices and throughput of 18,500 devices/hr. It employs advanced temperature-stabilization to cool devices to -40°C or heat them to 125°C, allowing it to test devices that must meet highest standards, such as those in automotive electronics and avionics. With Soft Touch Handling mechanism and interior motion controls, system provides accurate test environment.
Original Press Release:
Advantest Launches M4841 Dynamic Test Handler
High-throughput Device Handler for Volume Testing of MCUs and DSPs
TOKYO, Dec. 1 /-- Advantest Corporation , today announced that its new M4841 dynamic test handler, supporting packages including BGA, CSP, and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour, will debut at SEMICON Japan, December 6-8, at Chiba's Makuhari Messe. The handler will be available for shipment beginning April 2007.
Today's semiconductors are gaining in complexity both in circuit design and packaging, and continue to be challenged by high-volume applications that function in environments with wide-ranging temperatures. Semiconductor test and handling equipment must evolve to meet these requirements, in the same way it must adapt to increasing demands for higher parallelism and higher throughput.
Unique in its class, Advantest's new M4841 Dynamic Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal dynamic test handler for high volume production of devices used in consumer applications such as portable digital equipment and automotive systems.
16-Device Parallel Test Reduces Cost of Test
The M4841 is capable of parallel testing up to 16 devices, double the capability of the earlier, industry-leading handler, also from Advantest. The M4841 also delivers a high throughput of 18,500 devices per hour. With three times the throughput capacity of its predecessor, the M4841 sets a new standard for the industry. Because of its high test efficiency, the M4841 is well-suited for high-volume production lines. With its unprecedented combination of 16-device parallel test and 18,500 device-per-hour throughput at 3 seconds test time or less, the M4841 makes a substantial contribution to reduced cost of test.
Additionally, it employs an advanced temperature-stabilization method to cool devices to -40°C or heat them to 125°C, allowing it to test devices that must meet the highest standards, such as those used in automotive electronics and avionics, under a range of extreme environmental stresses.
Inheriting Advantest's acclaimed Soft Touch Handling mechanism, together with optimized interior motion controls, the M4841 provides a high-accuracy test environment. Customers can select the optimal configuration for their needs, as the company offers a range of parameters for parallel test capacity, temperature range, and processing capacity. This reduces installation costs and contributes to overall system optimization.
Key Specifications
M4841 Dynamic Test Handler
Target Packages: BGA, CSP, QFP, others
Parallel Test Capacity: maximum 16 devices
Throughput: 18,500 devices / hour
Temperature Range: -40°C ~ 125°C
About Advantest
Advantest Corporation is the global leader in automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at www.advantest.com.
CONTACT: Amy Gold, Advantest America, Inc., +1-212-850-6670, a.gold@advantest.com
