Circuit Test Probe monitors embedded USB 2.0 and inter-chip links.
Press Release Summary:
USB probe monitors embedded USB 2.0 and interchip links within multichip PCB assembly. Operating with entire line of LeCroy USB analyzers, probe supports tapping chip-to-chip links using low or full speed inter-chip signaling at all defined IC-USB voltages. Flying lead tap can be connected directly to inter-chip probe points using solder-in resistor connections. Probe can also be used to tap USB 2.0 links at standard 5 V signal levels.
Original Press Release:
LeCroy Expands Presence in Embedded USB Protocol Analysis with New Probe Fixture for Inter-Chip and Mobile Device Development
Santa Clara, CA - LeCroy Corporation, a worldwide leader for serial data test solutions today announced availability of a low-cost probe for monitoring embedded USB 2.0 and inter-chip links within a multi-chip PCB assembly. LeCroy's embedded USB probe allows accurate capture of both standard and reduced voltage inter-chip USB protocol data and operates with the entire line of LeCroy USB analyzers.
Inter-Chip USB (IC-USB) specification defines a standard methodology for using USB in chip-to-chip communications. Increasingly used as a replacement for i2C, IC-USB allows developers to control data transfers between endpoint functions within an embedded device. In many cases, developers can leverage on-board embedded USB host or hub logic that is frequently present on portable consumer electronics devices.
LeCroy's embedded probe supports tapping these chip-to-chip links using low or full speed Inter-chip signaling at all defined IC-USB voltages. These embedded USB links do not generally use standard USB connectors. These devices embed USB physical links directly in the printed circuit board. The embedded probe provides a flying lead tap that can be connected directly to Inter-chip probe points using solder-in resistor connections. The probe can also be used to tap USB 2.0 links at standard 5 volt signal levels.
"IC-USB is increasingly being used to provide faster transfers for digital images or audio content within a mutli-chip portable device - such as a smart phone", stated Mickey Romm, Director of Product Development at LeCroy. "The inter-chip probe and our USBMobile T2 analyzer provide everything the embedded developer needs to verify these transceiver-less USB applications".
About LeCroy
LeCroy Corporation is a worldwide leader in serial data test solutions, creating advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals. The Company offers highperformance oscilloscopes, serial data analyzers, and global communications protocol test solutions used by design engineers in the computer and semiconductor, data storage device, automotive and industrial, and military and aerospace markets. LeCroy's 45-year heritage of technical innovation is the foundation for its recognized leadership in "WaveShape Analysis"-capturing, viewing, and measuring the high-speed signals that drive today's information and communications technologies. LeCroy is headquartered in Chestnut Ridge, New York. Company information is available at www.lecroy.com.
© 2009 by LeCroy Corporation. All rights reserved. Specifications are subject to change without notice.
