Cascade Microtech Expands Capabilities of On-Wafer Power Device Characterization
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Collaborative Engineering Efforts Provide Full Compatibility of Agilent B1505A on Tesla System
BEAVERTON, OR, June 15, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced a set of new probes and accessories for its Tesla on-wafer power device characterization system, making it fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers an extended triaxial measurement range to accommodate low noise probing of power devices up to 2000 volts.
Emerging energy standards are driving demand for efficient power utilization, creating the need for accurate power device characterization in automotive, mobile devices, transportation, and power station manufacturing. There is a need to measure at increasing voltage and current levels when characterizing devices fabricated using new wide band gap materials such as silicon carbide (SiC) and gallium nitride (GaN). The award-winning Tesla system meets these demands by offering the industry's highest voltage and current range for on-wafer measurements up to 2000V triax/3000V coax, and 60A pulsed/20A continuous.
Combined with Agilent's B1505A power device analyzer, the new Tesla probes have been designed to take full advantage of the performance of the B1505A, meeting the requirements of more advanced device characterization applications.
"Power devices are prolific in today's semiconductor industry. Our customers are constantly striving to improve the efficiency of these critical IC components," says Geoff Wild, Chief Executive Officer, Cascade Microtech, Inc.
"The Tesla system facilitates on-wafer C-V, IV and breakdown measurements, which in turn enables faster development cycles at an overall lower cost-of-test versus packaged test. Unlike other solutions, the Cascade Microtech Tesla system allows users to realize the full potential of their B1505A, with the maximum range of voltage, current and application compatibility."
About TESLA
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade Microtech's award-winning TESLA on-wafer power device characterization system meets the challenge, reducing time-to-market for new power devices. Tesla is the industry's first power device measurement system that provides a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 60A and 3000V.
About Cascade Microtech
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in the precise electrical measurement and test of integrated circuits (ICs) and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, integrated circuits (ICs), IC packages, circuit boards and modules, MEMs, biological structures, electro-optic devices and more. Cascade Microtech's leading-edge semiconductor production test consumables include unique probe cards and test sockets that reduce manufacturing costs of high-speed and high-density semiconductor chips. Information about Cascade Microtech can be found on the Web at www.cascademicrotech.com.
