Automotive Transient Simulator includes various test pulses.
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Press Release Summary:
Ultra-Compact Simulator (UCS) for automotive transients, UCS 200M, incorporates EFT/burst generation, micropulse generation, and coupling network to carry EUT currents of up to 200 A, depending on configuration. FreeStyle Mode, offered via ISM ISO 4 Software, allows generation of micropulses with variable test voltages, rise-times, and pulse durations. Product can be combined with existing EM TEST load dump and battery supply simulators.
Original Press Release:
New EM Test Simulator for Automotive Transients Combines Wide Variety Of Test Pulses In One Ultra-Compact Box
Souderton, PA - August 25, 2004 - EM TEST has launched its brand new Ultra-Compact Simulator for automotive transients, UCS 200M. This compact tester incorporates EFT/Burst generation, Micropulse generation as per international standards and world-wide vehicle manufacturer specifications and the coupling network to carry EUT currents of up to 200A depending on the configuration. Apart from the standard test pulses the UCS 200M offers a FreeStyle Mode, via the ISM ISO 4 Software, to allow the generation of Micropulses with variable test voltages, rise-times & pulse durations.
Any existing EM TEST Load Dump and Battery Supply Simulator can be connected to the UCS 200M to use the coupling network as a common single-port connection point for the EUT.
Like all EM Test and AR Worldwide products, the UCS 200M is backed by AR Worldwide's commitment that quality must always equal value. The combination of innovative technology, advanced design, mismatch capability, durability, and flexibility with unlimited support and an unsurpassed warranty make AR products not only the best quality but the best value.
For more information contact AR Worldwide, 160 School House Rd. Souderton, PA 18964 at 215-723-8181 or at www.ar-worldwide.com. For an applications engineer, call 800-933-8181.
