Atomic Force Microscope offers scanning microwave microscopy.

Press Release Summary:



Compatible with Model 5500 AFM, Scanning Microwave Microscopy mode combines compound, calibrated electrical measurement capabilities of microwave vector network analyzer with spatial resolution of atomic force microscope. SMM nose cone is particularly useful for testing and characterizing semiconductors. It enables complex impedance measurements, and can be used to acquire calibrated capacitance and dopant density measurements as well.



Original Press Release:



Agilent Technologies Adds Scanning Microwave Microscopy Mode to Flagship 5500 AFM System



SANTA CLARA, Calif.,  – Agilent Technologies Inc. (NYSE: A) today announced the availability of scanning microwave microscopy (SMM) capabilities for its premier-performance atomic force microscope, the 5500 AFM. Agilent’s second-generation SMM nose cone makes this unique electrical measurement option compatible with the 5500 system.



“Thanks to a modular AFM design, we can now offer our innovative SMM mode to scientists who use the 5500, while also greatly improving the experience of those who have been performing scanning microwave microscopy measurements with our 5420 and 5600LS systems,” said Tianwei Jing, R&D manager for Agilent’s nanoinstrumentation facility in Chandler, Ariz. “The newly enhanced electrical measurement capabilities of the 5500 AFM complement its world-class imaging performance, outstanding application flexibility, and unparalleled environmental control.”



Agilent’s exclusive SMM mode combines the compound, calibrated electrical measurement capabilities of a microwave vector network analyzer with the outstanding spatial resolution of an atomic force microscope. SMM mode is particularly useful for testing and characterizing semiconductors. It enables complex impedance (resistance and reactance) measurements, and can be used to acquire calibrated capacitance and dopant density measurements as well. SMM works on all major semiconductor types and does not require an oxide layer.



The second-generation SMM nose cone significantly improves the user experience. Simplified setup of the scanner and nose cone reduces the number of steps required to begin collecting data and improves the probe exchange. The new nose cone is fully compatible with Agilent’s popular, high-precision 5420, 5500 and 5600LS AFM systems.



SMM mode is ideal for studying glasses, polymers, ceramics and metals, along with ferroelectric, dielectric and PZT materials. It is also perfect for investigating organic films, membranes and biological samples. Furthermore, SMM is highly useful for characterizing interfacial properties and contrast from molecular vibrational modes.



AFM Instrumentation from Agilent

Agilent offers high-precision, modular AFM solutions for research, industry and education. Worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies.



About Agilent Technologies

Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company’s 20,500 employees serve customers in more than 100 countries. Agilent had revenues of $6.9 billion in fiscal 2012. Information about Agilent is available at www.agilent.com.



NOTE TO EDITORS: Further technology, corporate citizenship, and executive news is available on the Agilent news site at www.agilent.com/go/news.

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