January 8, 2009 (Santa Barbara, CA): AVS and Asylum Research have announced that Asylum's MFP-3D(TM) NanoIndenter has been selected as one of the top five products exhibited at the AVS International Symposium in October. Asylum's MFP NanoIndenter is a true "instrumented" indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These characteristics and the use of state-of-the-art AFM sensors provide substantial advantages in accuracy, precision and sensitivity over other nanoindenting systems. Unlike cantilever indenters, the MFP NanoIndenter drives the indenting tip perpendicular to the surface. This vertical drive avoids the lateral movement and errors that are inherent in cantilever-based systems. Compared to conventional instrumented nanoindenters, the MFP NanoIndenter provides lower detection limits and higher resolution measurements of force and indentation depth with the superior precision of AFM sensing technology. The positioning accuracy is subnanometer using the MFP's closed loop nanopositioning sensors. The NanoIndenter can operate under fluid and at temperatures up to 300C.
Asylum Research President, Dr. Roger Proksch commented "Our MFP NanoIndenter offers clear advantages over both AFM-based and conventional nanoindenters and the AVS Product Award further validates our approach. The indenter is completely integrated with the AFM, providing the unique ability to quantify contact areas by performing AFM metrology of both the indenting tip and the resulting indentation. These direct measurements enable analysis of material properties with unprecedented accuracy relative to indirect calculation methods."
About Asylum Research
Asylum Research is the technology leader for atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Started by former employees of Digital Instruments in 1999, we are a company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 200 years combined AFM/SPM experience from our scientists, engineers and software developers. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers advanced imaging and measurement capabilities for a wide range of samples, including Dual AC(TM) mode, iDrive,(TM) Q-control, electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum's MFP-3D, set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first completely new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On(TM) automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Ask us about our legendary product and applications support and our exclusive 6-month money-back satisfaction guarantee.
Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM tips. We also supply a variety of accessories for AFM/SPM. We are dedicated to providing the most technically advanced AFM for researchers who want to take their experiments to the next level.
For additional information, contact
Terry Mehr, Director of Marketing Communications,
Monteith Heaton, EVP, Marketing and Business Development,
6310 Hollister Avenue,
Santa Barbara, CA 93117,
Keywords: Atomic Force Microscope (AFM)/Scanning Probe Microscope, Nanoindenter, AVS, Conference