Applied Analytics Reveals the Latest Edition of the ECLIPSE Process Software


Newest version of software to feature simultaneous multi-method analysis and improved user interface response. Software upgrades are available for all AAI analyzers worldwide starting December 15, 2008

Concord, MA - October 22, 2008 - Applied Analytics releases ECLIPSE Process 10, the newest version of its online analyzer software. By improving control over the detection system, ECLIPSE Process 10 allows for instantaneous user interface response. Furthermore, simultaneous Analysis and Calibration Methods (ACM) can now be configured. An ACM is essentially a method of calculation: a set of data and variables that both calibrate the instrument and determine the parameters of analysis. Using several ACMs simultaneously provides extensive insight into the condition of the process. The new software also includes diagnostics and reporting routines to continuously evaluate the performance of the system and trigger rapid action if required.

Features also include an ACM report generator, automatic light levels adjustment, fault alarm condition setup, software-controlled relay activation from each screen, and several other functions.

The ECLIPSE software is an integrated part of AAI's diode array analyzers. ECLIPSE Process controls the spectrometer and the sampling valves, obtains and interprets data from the detector, provides a user interface with which to change parameters, and produces an output signal for the DCS. The offline program allows the user to build an ACM, load or collect standards, and calibrate the analyzer.

Test-drive the new software by downloading the Eclipse Process 10 simulation program. Call AAI for more.

Software upgrades will be available starting December 15, 2008. Call AAI for more.

Applied Analytics, Inc.

29 Domino Drive

Concord, MA 01742

Toll Free: 888-461-0080 EXT 250

International: 978-287-4222 EXT 250

sales@a-a-inc.com

www.a-a-inc.com

All Topics