SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced that it will demonstrate its latest test solutions that meet the challenges of current and next-generation digital designs in memory, NVM Express, PCI Express, and SuperSpeed USB technology at the Intel Developer Forum, Sept. 10-12, at the Moscone Convention Center in San Francisco.
Memory Debug and Validation
Agilent experts will demonstrate solutions for probing and capturing traces of DDR3/4 and LPDDR2/3 memory signal flow. The Agilent U4154A 4-Gb/s logic analyzer, combined with FuturePlus DDR3/4 DIMM and SODIMM interposers or Agilent's custom DDR4 BGA interposers, provides deep insight into the functional behavior of industry's fastest memory designs.
Agilent will also demonstrate DDR3/4 debugging and testing with the world's fastest mixed-signal oscilloscope, the Infinium MSO90000 X-Series, which provides trigger and decode capabilities specifically designed for high-speed memory applications. In addition, Agilent's comprehensive memory-specific measurement software provides the performance analysis engineers need to optimize their high-speed memory designs.
NVM Express and PCI Express Testing
Agilent's new NVM Express solutions and complete suite of PCI Express® tools allows developers to optimize designs, from the physical (transmitter and receiver testing) to the protocol layer. Agilent's solutions combine multiprotocol analysis, traffic generation, performance and verification to accelerate debugging and validation.
Agilent experts will demonstrate PCI Express Gen 3 transceiver testing, using a high-performance Infiniium DSOX93204A oscilloscope. In addition, they will use an Agilent N2820A high-sensitivity current probe to show the power usage of the NVM Express drive in various power states. They will also demonstrate Agilent's new NVM Express decode software, along with the company's U4301A PCI Express analyzer. These instruments provide the high-performance NVM Express data capture and analysis engineers need to design leading-edge storage solutions.
Agilent will demonstrate how to ensure USB signal quality, using an oscilloscope to measure critical transceiver characteristics. A high-performance Infiniium DSO90000 X-Series oscilloscope will be used to make measurements from the high-speed J-BERT N4903B Bit Error Ratio Tester, at the USB 3.1 speed of 10 Gbit/s. The combined capabilities of these instruments allow engineers to push USB designs to the limit so they can quickly validate and troubleshoot their designs.
Agilent's Digital Test Standards Program
Agilent Digital Test Standards Program experts are involved in various international standards committees, including the Joint Electronic Devices Engineering Council, PCI-SIG, Video Electronics Standards Association, Serial ATA International Organization, Serial Attached SCSI (T10), USB-Implementers Forum, MIPI Alliance, Ethernet standards (IEEE 802.3), Optical Internetworking Forum and many others. Agilent's involvement in these standards groups enables the company to bring the right solutions to market when customers need them.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company's 20,500 employees serve customers in more than 100 countries. Agilent had net revenues of $6.9 billion in fiscal 2012. Information about Agilent is available at www.agilent.com.
PCI-SIG and PCI Express are U.S. registered trademarks of PCI-SIG.
Janet Smith, Americas