Product News:

Miniature Spectrometers cover UV to Mid-IR range.

Press Release Summary:

Miniature Spectrometers cover UV to Mid-IR range.

Dec 17, 2008 - Tailored to specific requirements, compact mini-spectrometers are offered in various integration levels that combine optical micro-component, detector, and electronic board. Measurement is possible via transmission, reflection, or back-scattering mode, and resolution is rated down to 5 nm (FWHM). Compatible with various types of detectors, products suit range of chemical analysis and process control applications throughout various industries.


Original Press Release

Silios Technologies at Photonics West Expo in San Jose, Calif., this January

Press release date: Dec 04, 2008

Chicago, December 4, 2008 SILIOS Technologies launches new series of very compact mini-spectrometers that cover a wide spectral range from UV to Mid-IR. SILIOS will be exhibiting at Photonics West 2009 in San Jose, Calif., from Jan. 27 to 29, on the French Pavilion at booth 6249.

Low-cost and reliable, they are tailored to specific customer requirements. These mini-spectrometers are suitable for a broad range of chemical analysis and process control applications, in water treatment, agrifood and medical fields, or oil and microelectronic industries. They combine a proprietary optical micro-component, manufactured in SILIOS' clean room facilities, a detector and an electronic board. The collective fabrication of optical chip (comparable to microelectronics) enables a drastic price-volume ratio reduction. In addition, the compactness of the spectrometer optical core is a huge advantage for measurement stability and reproducibility.

The customer can select one of the following integration levels:
- Optical chip: The chips are manufactured on wafers, sliced, controlled and packaged.
- Optical chip/imager: The chip is mounted on pixelized sensors.
- Optical chip/imager/electronic board: The optical chip/imager system is integrated on electronic board that delivers raw data to a USB link (or other), or it performs signal processing to deliver spectrum or instructions.
- Full spectrometer: This integrates an optical chip/imager/electronic board and suitable light source with mechanical parts.

The main characteristics of SILIOS' spectrometers include a measurement by transmission, reflection or back-scattering mode, a discrete spectrum delivery, the choice and number of wavelengths and the compatibility with various types of detectors (CCD, CMOS, Ge, AsGa, micro-bolometers, etc.) according to the targeted spectral range and a resolution down to 5 nm (FWHM).

For more information, please contact:

SILIOS TECHNOLOGIES Thierry Berthou Sales Manager ZI Peynier-Rousset Rue Gaston Imbert prolonge 13790 Peynier FRANCE Tel.: +33 (0)4 42 53 89 60 E-mail: Web:


FRENCH TECHNOLOGY PRESS OFFICE 205 North Michigan Avenue, Suite 3740 Chicago, IL 60601 Fax: (312) 327-5261 E-mail: