Semiconductor Characterization System has diverse functions.

Press Release Summary:



Model 4200-SCS with KTEI v7.1 software supports testing of high-power semiconductor devices. Software broadens capabilities of Model 4200-CVU (Capacitance-Voltage Unit), including support for characterizing semiconductor devices up to 200 Vdc (400 V differential) and up to 300 mA. KTEI v7.1 also adds support for differential DC bias and quasistatic C-V testing. With Model 4200-CVU-PWR CV Power Package, Model 4200-SCS can support higher power C-V, pulse I-V, and DC I-V applications.



Original Press Release:



KTEI V7.1 Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C-V, I-V, and Pulsed I-V Characterizations



Cleveland, Ohio - July 15, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company's award-winning Model 4200-SCS Semiconductor Characterization System. This software upgrade includes support for testing higher power semiconductor devices. With support for low-level device characterization through higher power devices, the Model 4200-SCS is the most complete semiconductor characterization analyzer on the market, making tough measurements easy and lowering the cost of test by protecting capital equipment investment. For more information on this free Model 4200-SCS upgrade, visit http://www.keithley.com/products/semiconductor/?mn=4200-SCS.

The KTEI V7.1 upgrade incorporates a number of innovative features and functions that broaden the capabilities of the Model 4200-CVU (Capacitance-Voltage Unit), including software support for characterizing higher power semiconductor devices at up to 200VDC (or 400V differential) and up to 300mA. This capability is useful for engineers working with laterally diffused MOS (LDMOS) and other higher power semiconductor devices in automotive, display, MEMS, and other high power applications. KTEI V7.1 also adds software support for other new functions:

o Differential DC bias

o Quasistatic C-V testing

o An expanded set of device test libraries

o A variety of software enhancements designed to speed and simplify testing

Higher Power Testing Support
The new Model 4200-CVU-PWR C-V Power Package hardware option is designed to work in tandem with the C-V software tools in KTEI V7.1 to allow C-V testing of high power devices at up to 200VDC (or 400VDC differential) and at up to 300mA. Such C-V testing is required for design, testing, and modeling of automotive electrical devices, MEMS, laterally diffused MOS (LDMOS), displays, and other higher power devices. With the addition of Keithley's Model 4200-CVU-PWR CV Power Package, the Model 4200-SCS now has the ability to support higher power C-V, pulse I-V (current-voltage), and DC I-V applications all in the same chassis.

Another important capability included in the upgrade is the use of differential DC biases. The Model 4200-CVU integrated C-V instrument's symmetrical circuitry, combined with a flash memory upgrade, allows applying up to 60V of differential DC bias on both C-V HI and C-V LO terminals. Keithley is the first parametric analyzer vendor to offer this unique capability, allowing more flexible control over the electric fields of devices being tested. This feature is especially useful for device modeling of unique devices such as nano components. The 4200-CVU firmware upgrade is included in KTEI V7.1, so there's no need to return the unit to the factory for reprogramming.

The software upgrade supports a novel quasistatic C-V measurement technique, the Ramp Rate Method, which uses the Model 4200-SCS's existing SMUs and preamplifiers. Quasistatic C-V techniques are appropriate for characterizing low power CMOS, high-k dielectrics, display devices, and other low leakage devices.

Ongoing System Enhancements Ensure Continuing Productivity
Keithley's Model 4200-SCS replaces a variety of electrical test tools with a single, tightly integrated characterization solution and is ideal for a wide variety of applications including semiconductor technology development, process development, and materials research in reliability labs, materials and device research labs and consortia, as well as any lab needing a benchtop DC or pulse instrument. Keithley has continually enhanced the Model 4200-SCS's hardware and software ever since its introduction. This commitment to ongoing system innovation assures a cost-effective upgrade path, so users don't have to buy a new parametric analyzer because their old one is obsolete. Systems can be upgraded cost-effectively to keep up with the industry's evolving test needs, so capital investments in the Model 4200-SCS stretch much further than with competitive test solutions.

Price and Availability
KTEI V7.1 is available immediately as a free upgrade for existing Model 4200-SCS systems and can be ordered by contacting a Keithley sales engineer. The Model 4200-CVU-PWR CV Power Package, also immediately available, can be ordered as an optional accessory.

For More Information
For more information on KTEI V7.1 or any of its other semiconductor test solutions, visit www.keithley.com/products/semiconductor/?mn=4200-SCS, or contact the company at:

Telephone:
800-688-9951
440-248-0400

FAX:
440-248-6168

E-mail:
publisher@keithley.com

Internet:
www.keithley.com

About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

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