Tier-1 Fab in Asia Placed Multiple Orders for Jordan Valley's JVX 6200 XRR Metrology Tool

Fabs using process technologies of 45nm and below are expected to expand their spending in 2010. The projected growth is set to strengthen the demand for Jordan Valley's metrology tools, which have already been adopted by leading suppliers

MIGDAL HA'EMEK, ISRAEL - Jordan Valley Semiconductors Ltd., a provider of semiconductor metrology solutions, announced today that a tier-1 fab in East Asia has placed multiple orders for Jordan Valley's JVX 6200 X-ray metrology tool for measuring copper process control (copper and seed barrier). The move strengthens Jordan Valley's penetration into the Asian market, following the adoption of JVX 6200 by Samsung and TSMC earlier this year.

According to Christian Gregor Dieseldorff, senior analyst of fab information of the SEMI Industry Research and Statistics group, "The spending on fab projects in 2010 is expected to increase by about 66% to $25.7 billion, with about 23 projects resuming or starting up. This trend is set to drive stronger demand for manufacturing equipment in general and for metrology tools in particular."

The JVX 6200 offers significant improvements in cost of ownership, extendibility and usability. The platform may include up to three metrology channels on a single system: XRR (X-Ray Reflectivity), XRF (X-Ray Fluorescence) and SAXS (Small Angle X-Ray Scattering) for high-speed and non-destructive characterization of all film types. The SAXS channel is capable of determining pore diameters in a Low-k film, down to sub-10Å. The JVX 6200 is utilized for advanced process control at the back-end of line (BEOL) as well as the front end of line (FEOL).

"The closer we get to the upturn in the global semiconductor market, the more urgent it becomes for fabs to invest in high quality metrology systems such as our JVX 6200," noted Isaac Mazor, Jordan Valley's President and CEO. "This recent move by the tier-1 Asian fab demonstrates these companies' awareness of the critical role that our metrology tools play in their ability to meet the surge in demand for chips we all expect in 2010."

About Jordan Valley Semiconductors

Jordan Valley Semiconductors, Ltd. is the leader in X-ray metrology solutions for advanced semiconductor fabs. The company's products are used by leading semiconductor manufacturers worldwide. Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE:CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (NASDAQ:ELRN).

Jordan Valley provides semiconductor metrology solutions for thin films front end of line (FEOL) and back end of line (BEOL), based on novel, rapid and non-destructive X-ray technology. The company offers a comprehensive family of solutions based on advanced X-Ray Reflectivity (XRR), X-Ray Fluorescence (XRF), Small-angle X-Ray scattering (SAXS) and High Resolution X-Ray Diffractometry (HR XRD). These tools are fully automated, production ready and ideal for both blanket and patterned wafers.

Jordan Valley's X-ray technology enables accurate and precise characterization of all film types, metals and dielectrics - including single and multi-layer stacks, High-k, metal gate and Low-k materials. It is also used for strain engineering (SiGe, SiC) and for advanced processes control and development (32nm and below, including 28nm, 22nm & 16nm) worldwide.

The company's research and development center is based in Migdal Ha'Emek, Israel. The manufacturing facilities are primarily based in Migdal Ha'Emek, with a secondary location in Durham, United Kingdom. Applications engineering, customer support services, sales and marketing are located in Migdal Ha'Emek with a demo lab, sales and application support in Austin, Texas, USA.

Company Contacts:
Headquarters sales contact:
Alon Kapel,
Jordan Valley Semiconductors Ltd.,
+972-4-6543666 ext. 134

SEA sales manager contact:
Ralph Kippen,
Jordan Valley Semiconductors Ltd.,

US Office contact:
Brenda Ortiz,
Jordan Valley Semiconductors, Inc.,

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