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NIST Workshop to address anticounterfeiting issues.
Press Release Summary:
Feb 13, 2009 - Product Authentication Management Workshop will be held February 17 and 18 at NIST's laboratories in Gaithersburg, MD. Presentations by experts from academia, industry, and government will address root causes of counterfeiting, information management strategies, and related standards being developed. Sponsored by NIST and SEMI, it will also include a presentation by Kevin Kurland on survey results regarding incidence of counterfeit electronics products in marketplace.
Original Press Release
Conference to Focus on Anti-Counterfeiting, Consumer Protection
Press release date: Feb 10, 2009
Presentations by experts from academia, industry and government will address the root causes of counterfeiting, information management strategies for mitigating and pre-empting counterfeits, and the standards that are being developed to combat the problem. The program will include a presentation by Kevin Kurland, director of the Department of Commerce's Bureau of Industry Security, Office of Technology Evaluation, concerning the results of a recent extensive survey regarding the incidence of electronic products in the marketplace.
The workshop is being sponsored by NIST and SEMI (Semiconductor Equipment and Materials International).
For more information, visit the conference Web site: http://semi.org/en/Standards/CTR_026948
Media representatives wishing to attend the workshop should contact Chad Boutin at (301) 975-4261, or email email@example.com.
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