Advanced Tutorial Offered at the 3rd Multifrequency AFM Conference in Madrid, Spain, on March 13th
January 26, 2011 (Santa Barbara, CA), Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), is offering a Bimodal AFM Tutorial on March 13, 2011 in conjunction with the 3rd Multifrequency AFM Conference in Madrid, Spain, March 14-15. The Bimodal AFM Tutorial is free of charge to conference attendees that want to increase their knowledge of multifrequency techniques, including cantilever physics, materials contrast, bimodal imaging theory, simulation with VEDA, and future directions of the technique. Techniques will be demonstrated on AFM instrumentation. Guest lecturers include world-renowned researchers in the field: Arvind Raman of Purdue University, Elena T. Herruzo, Instituto de Microelectrónica de Madrid, CSIC, Garcia Lab, and Roger Proksch of Asylum Research.
"This tutorial is ideal for the researcher that wants to learn more about materials contrast through multifrequency techniques," said Roger Proksch, President of Asylum Research. "AFM still faces numerous challenges to bring together molecular resolution imaging and quantification of material properties. Understanding higher harmonics and cantilever dynamics is clearly the next evolution of AFM that will take this research to a higher level."
Commented Prof. Ricardo Garcia, Conference Chair, "In 2011 we will commemorate the 25th anniversary of the invention of the AFM. AFM has become one of the main pillars that sustain the advanced nanoscience and nanotechnology. However, the AFM still faces challenges to bring together molecular resolution imaging and quantification of material properties. The need for higher compositional resolution and sensitivity has led to an evolution from single to multifrequency excitation and detection schemes. The Multifrequency conference and the Biomodal Tutorial aim to bring together AFM experts and newcomers to share knowledge on the instrumentation and theoretical aspects of the next generation of advanced force microscopes."
The afternoon tutorial will be held at the Ayre Gran Hotel in Colon, Spain, Multifrequency Conference headquarters. Registration for the Advanced Tutorial is limited to 15 people and will be based on a first-come, first-served basis. Additional information and registration can be found on the 3rd Multifrequency AFM Conference web site at
http://imm.cnm.csic.es/spm/multifrequency/scope.html.
About Asylum Research
See what our users are saying about Asylum Research at: http://www.asylumresearch.com/References/Testimonials.shtml
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On(TM) automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive(TM) tips.
Keywords: AFM Class, Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM)
For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP, Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.
