Edax Inc.
Mahwah, NJ 07430
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EDAX Announces Performance Enhancements for the Hikari Electron Backscatter Detector
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, announced its latest advancements on high-speed EBSD data acquisition. The Hikari once again raises the standard for high-speed EBSD pattern collection and orientation measurement , explains Del Redfern, Product Marketing Manager at EDAX. Combined with our market and technology-leading Orientation...
Read More »Edax and Carl Zeiss SMT Showcase New OIM(TM) 3d EBSD at Microscopy and Microanalysis 2006
Booth # 416, July 31 - August 3, 2006 MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron backscatter diffraction (EBSD) instrumentation, in partnership with Carl Zeiss SMT, showcased OIM 3D, the new three-dimensional Orientation Imaging Microscopy (OIM) EBSD product, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006, at the Navy Pier Convention...
Read More »Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, showcased its newest high-speed EBSD detector, the Hikari, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006 at the Navy Pier Convention Center, Chicago, Illinois. The Hikari detector provides a significant increase in EBSD pattern collection speed over current...
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Microanalysis System combines EDS, EBSD, and WDS.
Offered as 3-in-1 analysis tool, Trident microanalysis system combines X-ray microanalysis (EDS), electron diffraction (EBSD), and wavelength dispersal spectrometry (WDS). System's hardware and software integrate all above-listed techniques into one PC environment with data sharing and combining. This enables scientists to characterize composition and structure of materials on micro-scale.
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Microanalysis Software includes Free Draw feature.
GENESIS v3.6 includes Phase Cluster Analysis (PCA) and Gun Shot Residue (GSR) features. PCA option provides statistical analysis for spectral mapping data and allows user to automatically find phases in recorded data. GSR option utilizes Phase Particle software capabilities with application specific functions and includes auto calibration of thresholds in back scattered signal. Free draw consists...
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Microanalysis Software displays up to 36 images.
GENESIS EDS v3.5 offers support for digital pulse processing (DPP II) hardware and multiple spectrum overlays. Mapping view mode enables up to 36 images to be displayed, while stub view mode permits review of multi-field maps. DPP II hardware allows software to handle input rates of over 150,000 counts per second.
Read More »Machinery suit Electron Backscatter Diffraction.
Electron Backscatter Diffraction (EBSD) System models OIM 2000, OIM 4000, and OIM 7000 include EBSD cameras, data collection, and analysis software that provides various tools for characterizing crystalline microstructures. Units also incorporate ChI-Scan, which takes advantage of simultaneously collected EDS and EBSD data to handle multi-phase samples.
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Analyzer measures coatings of small to mid-sized parts.
Equipped with laser for rapid sample positioning, CoatMaster 350 XRF coating thickness measurement machine is offered with choice of collimators of various sizes and Z motorized stage. Software is included for coating thickness measurements, compositional analysis, report generation, element identification, and/or bath analysis measurement. Unit may also be used for jewelry analysis to provide...
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Machine measures coating thickness of large parts.
CoatMaster 550, with 23.6 x 13.8 in. chamber, incorporates X-Y motorized stage and supports movement in Z direction via moveable head. Offered with choice of EZ-Load stage that automatically moves in/out of chamber or non EZ-Load heavy-duty stage that accommodates up to 44 lbs, unit has automated multi-collimator changer that holds up to 4 collimators of various sizes. Software is provided for...
Read More »Software facilitates FDA 21 CFR Part 11 compliance.
E-Sig software, for GENESIS X-ray Microanalysis System, provides electronic signatures as required by 21 CFR Part 11 and satisfies US FDA security and audit trail requirements. Spectra collected can be electronically archived with date and time stamp. Primary data cannot be altered. Any changes are tagged and tracked, and levels of data processing are restricted based on permissions set by...
Read More »EDAX Announces Sales Agreement with Angstrom Scientific
Mahwah, NJ, April 8, 2020 – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has signed a distributor agreement with Angstrom Scientific. The agreement allows Angstrom Scientific to sell all EDAX products in the United States. “We are excited to welcome Angstrom Scientific to the EDAX sales team,” said EDAX U.S. Sales Manager, Roger Kerstin. “With over...
Read More »Covalent Metrology Announces Collaboration with EDAX, Inc.
Mahwah, NJ, and Sunnyvale, CA, September 18, 2018 – Covalent Metrology, an innovative, new analytical service lab based in Silicon Valley, announced today that it will collaborate with EDAX, Inc., a business unit of AMETEK, Inc., on the application of energy dispersive spectroscopy (EDS) for the quantified characterization of a wide variety of materials. Covalent undertook an extensive...
Read More »EDAX Announces Performance Enhancements for the Hikari Electron Backscatter Detector
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, announced its latest advancements on high-speed EBSD data acquisition. The Hikari once again raises the standard for high-speed EBSD pattern collection and orientation measurement , explains Del Redfern, Product Marketing Manager at EDAX. Combined with our market and technology-leading Orientation...
Read More »AMETEK Electromotory S.R.O. Marks 10th Anniversay
Contact: James P. McKinley (610) 889-5234 NACHOD, CZECH REPUBLIC, October 2, 2006--AMETEK electromotory, s.r.o., a unit of the Electromechanical Group (EMG) of AMETEK, Inc., celebrated its 10th anniversary this month with a visit from AMETEK EMG Group President Timothy N. Jones. We are extremely pleased by AMETEK electromotory's 10-year record of achievement. Over the past decade, it has become...
Read More »Ametek Names Rodrigo Rubiano As Business Unit Manager For EDAX
MAHWAH, NJ, February 1, 2007 - AMETEK, Inc., has named Rodrigo Rubiano as Division Vice President and Business Unit Manager for EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation. Mr. Rubiano comes to AMETEK from Tyco Electronics, where he most recently served as General Manager of its Magnetics Group. We are pleased to have Rodrigo join AMETEK, comments Alan...
Read More »AMETEK-® Pittman Inc. and Avnet Electronics Marketing Sign Distribution Agreement
AMETEKÃ-® Pittman Inc. has entered into a distribution agreement with Avnet Electronics Marketing. Under the agreement, Avnet Electronics Marketing will serve as a stocking distributor worldwide for all PITTMANÃ-® brand products, effective immediately. The resulting partnership is expected to expand opportunities for both companies and provide their customers with enhanced motor solutions...
Read More »AMETEK Forms Ultra Precision Technologies Division
New Division Combines Taylor Hobson, Solatron Metrology and Precitech Paoli, PA, January 26, 2007 -AMETEK Inc. has formed a new Ultra Precision Technologies Division that brings together its Taylor Hobson Division with two more recently acquired businesses: Solartron Metrology and Precitech. All three businesses-Taylor Hobson, Solartron Metrology and Precitech-have strong organizations, enjoy...
Read More »Department Of Homeland Security Selects Ametek To Supply Portable Radiation Detection System
Paoli, PA, October 26, 2006 - The U.S. Department of Homeland Security (DHS) has awarded a contract to AMETEK (NYSE:AME) for the design, development and production of a high-resolution portable radiation detection system. The system will be used by U.S. Customs and Border Protection, public safety officials and other first responders to screen vehicles and search public facilities for potentially...
Read More »Edax and Carl Zeiss SMT Showcase New OIM(TM) 3d EBSD at Microscopy and Microanalysis 2006
Booth # 416, July 31 - August 3, 2006 MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron backscatter diffraction (EBSD) instrumentation, in partnership with Carl Zeiss SMT, showcased OIM 3D, the new three-dimensional Orientation Imaging Microscopy (OIM) EBSD product, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006, at the Navy Pier Convention...
Read More »Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, showcased its newest high-speed EBSD detector, the Hikari, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006 at the Navy Pier Convention Center, Chicago, Illinois. The Hikari detector provides a significant increase in EBSD pattern collection speed over current...
Read More »