Rudolph Technologies, Inc.

Machinery & Machining Tools

Rudolph Technologies Delivers Cost Effective, High-Performance Inspection Solution to Meet Unique Requirements at European Fab

Rudolph's depth of application knowledge and breadth of inspection solutions continues to advance market share leadership San Francisco, CA (July 11, 2006)-Rudolph Technologies, Inc. (NASDAQ: RTEC), the market leader in macro defect inspection, today announced a repeat order for multiple NSX(TM) 115 Macro Defect Inspection systems for installation at two fabs owned by a large European...

Read More »
Machinery & Machining Tools

Taiwan Foundry Sets Standard for Opaque Film Process Control-Orders New Metapulse-III Systems from Rudolph

Next-generation PULSE tool offers a low cost of ownership and a modular design for cost-effective upgrades San Francisco, CA (July 11, 2006)-Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader of high-performance process control metrology, defect inspection, and data analysis systems for semiconductor manufacturing, today announced a multiple-unit sale of its recently-launched...

Read More »
Software

Rudolph Concludes Successful JDP, Adapting Process Sentinel Defect Classification Software to Meet Accuracy and Speed Requirements

Product's ability to recognize and classify systemic process issues influences purchase decision San Francisco, CA (July 11, 2006)-Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process control equipment for thin film measurement, macro defect inspection, and yield management software, today announced multiple orders from a North American microprocessor manufacturer for its...

Read More »
Sensors, Monitors & Transducers

Rudolph Technologies Edges into Micro Inspection Space with High Throughput Macro Tools

Asia foundry purchases multiple AXi 935 Systems to obtain high resolution required for OQA and etch applications San Francisco, CA (July 11, 2006)-Rudolph Technologies, Inc. (NASDAQ: RTEC) today announced the sale of multiple AXi(TM) 935 Macro Defect Inspection Systems to a major foundry in Asia. The systems are destined for a Singapore facility where they will initially support etch processes...

Read More »
Software

Software facilitates automatic defect classification.

For learn-as-you-go incorporation of previously unclassified defects, TrueADC(TM) (Automatic Defect Classification) system has Dynamic Defect Library function that facilitates expansion of library to adjust for new defects or process variations without specific engineering involvement. It comes with custom pre-shipment library development based on customer-provided defect images. Database and...

Read More »
Test & Measurement

Metrology Tools measure thin transparent films.

Utilizing FOCUS(TM) beam ellipsometry, S3000(TM) (300 mm) and S2000(TM) (200 mm) measure transparent films throughout device fabrication process. Laser light sources are used for optimal accuracy, stability, spot size, and tool-to-tool matching. Also provided, optional deep UV and visible reflectometry capabilities offer flexibility in addressing various applications throughout fabrication. Built...

Read More »

Two U.S. Chipmakers Formally Recognize Rudolph All-Surface Macro Inspection System with Best of Breed Status

Flanders, New Jersey (May 17, 2006)-Rudolph Technologies, Inc. (NASDAQ:RTEC), the market leader in advanced macro defect inspection technologies, announced today that two major U.S. semiconductor manufacturers have designated Rudolph's all-surface, macro defect inspection system as best of breed. As automated inspection has brought frontside macro defects under greater control, chip manufacturers...

Read More »

Inspection System targets critical edge defects.

Using multiple color cameras, concurrent color image capture, and intrinsic ADC, E25(TM) System detects and classifies defects based on size, morphology, color, and location. Algorithm creates defect-free surface model of edge and uses model to detect defects. System provides edge inspection for CMP, etch, clean, deposition, pre-RTP, and final QA processes, and is designed to cope with curved...

Read More »
Test & Measurement

Rudolph Technologies Announces Multiple-Tool Order from Premier Memory Solutions Provider in Taiwan

DRAM manufacturer intends to boost yield with automated macro defect inspection Flanders, New Jersey, March 13, 2006Â-¯Rudolph Technologies, Inc. (Nasdaq: RTEC), a leading provider of process control equipment for thin film measurement and macrodefect inspection during integrated circuit manufacturing, announced today the completion of a multiple system sale to a premier memory solutions...

Read More »

All Topics

COVID-19 Response Suppliers COVID-19 Response:
Can Your Company Help Provide Critical Supplies?

We are using the power of our platform to aid in the mass shortage of critical supplies. If your company can help provide supplies, capabilities, or materials for products such as N-95 Masks and Tyvek SuitsPlease let us know.

COVID-19 Response Suppliers