Rudolph Technologies, Inc.
550 Clark Drive
Budd Lake, NJ 07828
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Rudolph's Discover Yield Management Software Gains Traction in Advanced Packaging Applications
Back-end manufacturers adopt front-end strategies to maximize yields with analysis of inspection and metrology data Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, FPD, LED and solar industries, announced today the sale of its DiscoverÃ-® Yield Management Software to a major...
Read More »Rudolph's Discover Yield Management Software Gains Traction in Advanced Packaging Applications
Back-end manufacturers adopt front-end strategies to maximize yields with analysis of inspection and metrology data Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, FPD, LED and solar industries, announced today the sale of its Discover-® Yield Management Software to a major outsourced...
Read More »Complete Lithography System meets advanced packaging needs.
Accommodating needs of semiconductor advanced packaging market, JetStep™ total lithography system- delivers full, closed-loop control. Components include JetStep 2X reduction stepper integrated with Rudolph equipment automation and fault detection software; NSX® inspection tool for CD overlay measurements; ProcessWORKS® APC run-to-run control system software; ARTIST® fault detection...
Read More »Complete Lithography System meets advanced packaging needs.
Accommodating needs of semiconductor advanced packaging market, JetStep™ total lithography systemÃ- delivers full, closed-loop control. Components include JetStep 2X reduction stepper integrated with Rudolph equipment automation and fault detection software; NSXî inspection tool for CD overlay measurements; ProcessWORKSî APC run-to-run control system software; ARTISTî...
Read More »Rudolph's Yield Management System Chosen for Manufacture of High Definition Displays in Mobile Devices
Genesis-® Enterprise offline yield analysis and data management will be used to maximize factory efficiency and identify causes of yield loss Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, FPD, LED and solar industries, announced today the sale of its Genesis Enterprise yield...
Read More »Rudolph's Yield Management System Chosen for Manufacture of High Definition Displays in Mobile Devices
GenesisÃ-® Enterprise offline yield analysis and data management will be used to maximize factory efficiency and identify causes of yield loss Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, FPD, LED and solar industries, announced today the sale of its Genesis Enterprise yield...
Read More »Rudolph's MetaPULSE System Selected for Advanced Packaging R&D
Dynamic growth in advanced packaging arena drives need for critical process characterization technologies Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of inspection, metrology and process control software for semiconductor manufacturing, announced today that a premier global industry research center in Asia has purchased Rudolph's MetaPULSE-® G Metrology...
Read More »Rudolph's MetaPULSE System Selected for Advanced Packaging R&D
Dynamic growth in advanced packaging arena drives need for critical process characterization technologies Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of inspection, metrology and process control software for semiconductor manufacturing, announced today that a premier global industry research center in Asia has purchased Rudolph's MetaPULSEÃ-® G...
Read More »Thin Film Metrology System meets needs of mobile display market.
Combining MetaPULSE measurement head with customized glass substrate handling, MetaPULSE-® FP uses Picosecond Ultrasonic Laser Sonar (PULSE(TM)) Technology to measure critical thickness of metal layers deposited during manufacturing process. This lends to precise process control while providing non-contact, non-destructive, on-product measurements of single- and multi-layered opaque thin films.
Read More »Thin Film Metrology System meets needs of mobile display market.
Combining MetaPULSE measurement head with customized glass substrate handling, MetaPULSEÃ-® FP uses Picosecond Ultrasonic Laser Sonar (PULSE(TM)) Technology to measure critical thickness of metal layers deposited during manufacturing process. This lends to precise process control while providing non-contact, non-destructive, on-product measurements of single- and multi-layered opaque thin...
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