Rudolph Technologies, Inc.

Test & Measurement

Rudolph Wins Multiple System Orders for Its Latest MetaPULSE-G Metrology System

Combining improved sensitivity to copper, on product measurement capability, and cost of ownership improvements drive acceptance for high volume interconnect metrology Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announced today that it has received multiple...

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Sensors, Monitors & Transducers

Rudolph Technologies Expands into LED Market

Leading HB-LED manufacturers worldwide add inspection systems and software to improve process yields and reduce manufacturing costs FLANDERS, NJ - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software that is designed to improve yield for the microelectronics and solar manufacturing industries, announced today that it has expanded into...

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Services

Rudolph Technologies Collaborates in Advanced Packaging Integration

Development collaboration includes: leading process tool supplier, IC device manufacturer and Rudolph Technologies, which will provide the inspection systems Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities announced today that it will collaborate with a leading...

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Test & Measurement

Rudolph Technologies Receives Multiple Back-end Orders from Major European Semiconductor Manufacturer

Increased adoption of electronics in automobiles contributes to high growth in automotive semiconductor market Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor manufacturing industry, announced today that it has received multiple orders for its NSX® Inspection System from a major...

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Rudolph Technologies Collaborates with Asia OSAT on Development and Characterization of Stacked Packaging Processes
Test & Measurement

Rudolph Technologies Collaborates with Asia OSAT on Development and Characterization of Stacked Packaging Processes

Rudolph to provide 2D defect inspection, 3D solder bump and TSV depth metrology as well as data analysis and trending software to major OSAT in Asia Flanders, New Jersey-Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announced today that it is partnering with a major semiconductor...

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Die Sort Classification Software helps find product defects.
Software

Die Sort Classification Software helps find product defects.

Discover Fast Review and Die Sort Classification Software eases review of backend manufacturing defects detected by NSX® Series automated macro defect inspection system. Program automatically classifies defects, on-line or off-line, through various analytical operations, and distinguishes nuisance defects that do not impact yield from those that require further off-line investigation. Once...

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Metrology System improves fab productivity.
Test & Measurement

Metrology System improves fab productivity.

Built on Vanguard-II automation platform, S3000S(TM) is suited for in-line process control of advanced diffusion and fab-wide thin film applications. Optical design enables simultaneous measurement with multi-wavelength, multi-angle Focus Beam Ellipsometry and deep ultraviolet reflectometry, minimizing measurement time and optimizing throughput. Optional MAControl(TM) module enables one-step,...

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Metrology System offers copper process control solution.
Test & Measurement

Metrology System offers copper process control solution.

Measuring 60-80 product wafers/hr, MetaPULSE®-G thin film measurement tool is optimized specifically for copper damascene processes at 45 through 22 nm technology nodes and copper via fill in 3D IC applications. Tool uses green wavelength laser for measurement repeatability better than 0.3%. System's 10 x 10 Â-µm spot size is small enough to measure wafers in 30 x 30 µm or...

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Software optimizes solar cell production.
Software

Software optimizes solar cell production.

Helping photovoltaic (PV) manufacturers increase cell efficiency, Discover Solar(TM) incorporates database structure and analysis engine optimized for unique requirements of high-volume production. Engineers can monitor health of complete production line, identifying tool and sub-component problems as well as incoming material issues. Fab management software tool offers statistical process...

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