Onto Innovation Inc.
Wilmington, MA 01887
New Dragonfly G3 Inspection Platform Includes Optical System with Sub-micron Resolution
Meets advanced 2D and 3D sensitivity requirements for advanced packaging and specialty device manufacturers. Utilizes 3D metrology system using a revolutionary dual head design that improves 3D bump measurement throughput up to 50%. Includes 2D defect detection capability in bright field, dark field or Clearfind® illumination mode.
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Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System
Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations...
Read More »
New Dragonfly G3 Inspection Platform Includes Optical System with Sub-micron Resolution
Meets advanced 2D and 3D sensitivity requirements for advanced packaging and specialty device manufacturers. Utilizes 3D metrology system using a revolutionary dual head design that improves 3D bump measurement throughput up to 50%. Includes 2D defect detection capability in bright field, dark field or Clearfind® illumination mode.
Read More »
Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System
Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations...
Read More »