Xcerra Corp.

Latest MT2168 XT Pick-and-Place Handler Optimizes Test Floor Processes
Material Handling & Storage

Latest MT2168 XT Pick-and-Place Handler Optimizes Test Floor Processes

Xcerra’s MT2168 XT Pick-and-Place Handler is now offered with double device detection and automatic temperature calibration options. The unit is offered with optical distance with laser that checks socket for emptiness before the next package to be plunged. The automatic temperature calibration depends on optional measurement equipment and is controlled by handler software without the...

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Testing of LED Devices with Superior Temperature Performance
Material Handling & Storage

Testing of LED Devices with Superior Temperature Performance

Rosenheim (Germany), August 2018: The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED devices with best temperature performance. The Xcerra solution leverages the exceptional temperature accuracy of the well-established...

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Testing Modules and Multi-Chip Packages in the Full Temperature Range: Xcerra's MT2168 XT Semiconductor Test Handler Installed as a Flexible and Efficient Alternative to Dedicated Module Test Solutions
Material Handling & Storage

Testing Modules and Multi-Chip Packages in the Full Temperature Range: Xcerra's MT2168 XT Semiconductor Test Handler Installed as a Flexible and Efficient Alternative to Dedicated Module Test Solutions

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions Rosenheim (Germany), July 2018: The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets...

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Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System
Test & Measurement

Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System

Diamondx Semiconductor Test System Used in Testing a Broad Range of Device Types for the Automotive, Consumer, Industrial and Mobility markets Norwood, Mass., July 17, 2018 — Xcerra (Nasdaq: XCRA), today announced that it has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SOC) test system. The 500th test system was delivered to...

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Xcerra Test Cell Solutions Expand to the Japan Market
Electrical Equipment & Systems

Xcerra Test Cell Solutions Expand to the Japan Market

Xcerra to deliver a complete and fully integrated test cell for barometric pressure sensors Norwood, February 2018 - Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced today that a leading global manufacturer of high-quality electronic components located in Japan, has placed an order for a complete test cell for barometric...

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Electrical Equipment & Systems

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn-key test cell for MEMS in Asia NorwoodÂ- – Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The...

Read More »
Latest MT2168 XT Pick-and-Place Handler Optimizes Test Floor Processes
Material Handling & Storage

Latest MT2168 XT Pick-and-Place Handler Optimizes Test Floor Processes

Xcerra’s MT2168 XT Pick-and-Place Handler is now offered with double device detection and automatic temperature calibration options. The unit is offered with optical distance with laser that checks socket for emptiness before the next package to be plunged. The automatic temperature calibration depends on optional measurement equipment and is controlled by handler software without the...

Read More »
Testing of LED Devices with Superior Temperature Performance
Material Handling & Storage

Testing of LED Devices with Superior Temperature Performance

Rosenheim (Germany), August 2018: The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED devices with best temperature performance. The Xcerra solution leverages the exceptional temperature accuracy of the well-established...

Read More »
Testing Modules and Multi-Chip Packages in the Full Temperature Range: Xcerra's MT2168 XT Semiconductor Test Handler Installed as a Flexible and Efficient Alternative to Dedicated Module Test Solutions
Material Handling & Storage

Testing Modules and Multi-Chip Packages in the Full Temperature Range: Xcerra's MT2168 XT Semiconductor Test Handler Installed as a Flexible and Efficient Alternative to Dedicated Module Test Solutions

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions Rosenheim (Germany), July 2018: The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets...

Read More »
Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System
Test & Measurement

Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System

Diamondx Semiconductor Test System Used in Testing a Broad Range of Device Types for the Automotive, Consumer, Industrial and Mobility markets Norwood, Mass., July 17, 2018 — Xcerra (Nasdaq: XCRA), today announced that it has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SOC) test system. The 500th test system was delivered to...

Read More »
Company News

Xcerra Announces Preferred Supplier Agreement with Elmos

Xcerra testers offer high quality and efficiency of test solutions for automotive semiconductor and sensor devices Norwood, Mass., March 26, 2018 — Xcerra today announced that it has entered into a preferred supplier agreement with Elmos, a supplier of semiconductor and sensor devices to the automotive industry. Under the terms of the multiyear agreement Xcerra will be the exclusive supplier of...

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Xcerra Test Cell Solutions Expand to the Japan Market
Electrical Equipment & Systems

Xcerra Test Cell Solutions Expand to the Japan Market

Xcerra to deliver a complete and fully integrated test cell for barometric pressure sensors Norwood, February 2018 - Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced today that a leading global manufacturer of high-quality electronic components located in Japan, has placed an order for a complete test cell for barometric...

Read More »
Company News

Xcerra Test Cell Qualified for Barometric Test at Major European IDM

Optimized for high yield, low cost and greatest flexibility Norwood, January 2018: Xcerra continues to expand its TCI (Test Cell Innovation) customer base after completing a qualification at a major European IDM for a fully integrated and prevalidated test cell for barometric sensor test. The solution consists of a Multitest InStrip handler with InBaro module, an LTX-Credence Diamondx ATE and...

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Electrical Equipment & Systems

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn-key test cell for MEMS in Asia NorwoodÂ- – Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The...

Read More »

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