ISRA VISION

New SMASH Inspection System Offers Enhanced Inspection, Illumination
Test & Measurement

New SMASH Inspection System Offers Enhanced Inspection, Illumination

The SMASH Inspection System is offered with enhanced inspection and illumination channels. The system provides 100% inline defect inspection and monitoring of optical properties. The system enables user to draw data from all deployed inspection systems and store in the database. It is embedded with SMART LINE LED light source technology for inspecting film defects and supervising optical features.

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NetGAGE3D White Light Interferometer Offers Highly Accurate Inspection Measurements
Optics & Photonics

NetGAGE3D White Light Interferometer Offers Highly Accurate Inspection Measurements

The NetGAGE3D Plus White Light Interferometer offers accurate measurement results in the nm range. The unit is tailored with short measurement times and batch processing functions. The product offers both touchscreens and conventional input methods (keyboard and mouse). The meter is suitable as a cycle-controlled measurement technology in electronic industry. The NetGAGE3D allows users to...

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ISRA VISION Introduces New Wafer Edge Inspection System for Production Quality Control
Test & Measurement

ISRA VISION Introduces New Wafer Edge Inspection System for Production Quality Control

The EdgeScan Inspection System’s line camera cheks edge of the wafer simultaneously from three sides during the preadjustment. The multiview technology of the system deflects the image by 45 degrees to create three views that make it possible to view the component from 360 degrees. The product can be used as an OEM product throughout the entire process and for every type of wafer.

Read More »
New SMASH Inspection System Offers Enhanced Inspection, Illumination
Test & Measurement

New SMASH Inspection System Offers Enhanced Inspection, Illumination

The SMASH Inspection System is offered with enhanced inspection and illumination channels. The system provides 100% inline defect inspection and monitoring of optical properties. The system enables user to draw data from all deployed inspection systems and store in the database. It is embedded with SMART LINE LED light source technology for inspecting film defects and supervising optical features.

Read More »
NetGAGE3D White Light Interferometer Offers Highly Accurate Inspection Measurements
Optics & Photonics

NetGAGE3D White Light Interferometer Offers Highly Accurate Inspection Measurements

The NetGAGE3D Plus White Light Interferometer offers accurate measurement results in the nm range. The unit is tailored with short measurement times and batch processing functions. The product offers both touchscreens and conventional input methods (keyboard and mouse). The meter is suitable as a cycle-controlled measurement technology in electronic industry. The NetGAGE3D allows users to...

Read More »
ISRA VISION Introduces New Wafer Edge Inspection System for Production Quality Control
Test & Measurement

ISRA VISION Introduces New Wafer Edge Inspection System for Production Quality Control

The EdgeScan Inspection System’s line camera cheks edge of the wafer simultaneously from three sides during the preadjustment. The multiview technology of the system deflects the image by 45 degrees to create three views that make it possible to view the component from 360 degrees. The product can be used as an OEM product throughout the entire process and for every type of wafer.

Read More »

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