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Mass Spectrometer offers trace elemental detection.
With 1.5 GHz/ppm sensitivity, aurora Elite Inductively Coupled Plasma Mass Spectrometer provides precise and accurate quantification at single digit ppt levels and below. Low oxide ratios using turner-interlaced coils ensures robust plasma conditions for complete matrix decomposition, all without plasma shield or guard electrode. In addition to Collision Reaction Interface, spectrometer...
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High-Contrast Probe Tips offer complete TERS solution.
By enabling Tip-Enhanced Raman Spectroscopy,Ã- IRIS TERS Probe Tips provide complete path to non-destructive, label-free chemical detection at nanoscale. Sharp, solid-gold cones are optimized for highest TERS enhancement at red and near-infrared Raman excitation wavelengths, maximizing sensitivity and spatial resolution. When utilized on Innova-IRIS systems, probes enable TERS on opaque...
Read More »Mechanical Testing Tool integrates optical profiling.
Universal Mechanical Tester (UMT) enables rotary to reciprocating motion, sub-newton to kilo-newton force measurement, or environmental testing from room temperature up to 1,000Ã-
Read More »AFM Zoom Option enhances 3D optical microscope capabilities.
With NanoLens™ Atomic Force Microscope (AFM) accessory, users of ContourGTÃ-® microscopes can perform nanometer-scale surface and material property analysis on same system that provides repeatable and versatile 3D optical microscopy measurements. Product is designed for installation on 5-position, fully automated turret and delivers high-resolution (1,000x)Ã- imaging capabilities...
Read More »Mass Spectrometer offers trace elemental detection.
With 1.5 GHz/ppm sensitivity, aurora Elite Inductively Coupled Plasma Mass Spectrometer provides precise and accurate quantification at single digit ppt levels and below. Low oxide ratios using turner-interlaced coils ensures robust plasma conditions for complete matrix decomposition, all without plasma shield or guard electrode. In addition to Collision Reaction Interface, spectrometer...
Read More »
High-Contrast Probe Tips offer complete TERS solution.
By enabling Tip-Enhanced Raman Spectroscopy,Ã- IRIS TERS Probe Tips provide complete path to non-destructive, label-free chemical detection at nanoscale. Sharp, solid-gold cones are optimized for highest TERS enhancement at red and near-infrared Raman excitation wavelengths, maximizing sensitivity and spatial resolution. When utilized on Innova-IRIS systems, probes enable TERS on opaque...
Read More »Mechanical Testing Tool integrates optical profiling.
Universal Mechanical Tester (UMT) enables rotary to reciprocating motion, sub-newton to kilo-newton force measurement, or environmental testing from room temperature up to 1,000Ã-
Read More »AFM Zoom Option enhances 3D optical microscope capabilities.
With NanoLens™ Atomic Force Microscope (AFM) accessory, users of ContourGTÃ-® microscopes can perform nanometer-scale surface and material property analysis on same system that provides repeatable and versatile 3D optical microscopy measurements. Product is designed for installation on 5-position, fully automated turret and delivers high-resolution (1,000x)Ã- imaging capabilities...
Read More »Bruker Announces Agreement to Acquire CETR
Bruker Corporation today announced the signing of a purchase agreement to acquire Center for Tribology, Inc. (CETR) for an undisclosed amount. CETR, a privately held corporation located in Silicon Valley in Campbell, CA, is projected to have calendar year 2011 revenue greater than $10 million and EBITDA greater than $2 million. The transaction is expected to close at the end of the third quarter...
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