Nova Measuring Instruments, Inc.
Fremont, CA 94538
Metrology System meets requirements of IC manufacturing.
Identifying changes and irregularities in film microstructure, Crystalx II(TM) wide angle X-ray diffraction metrology system provides quick quantitative full wafer measurements of crystallographic texture, phase, and relative grain size. Suitable for process development and production, monitoring tool uses 2D area detector for collection of multiple diffraction peaks at multiple angles...
Read More »Nova to Expand Offices in Taiwan with New Cleanroom and Training Center
REHOVOT, Israel, Jan. 6, 2021 /PRNewswire/ -- Nova (NASDAQ: NVMI) celebrated today Nova Taiwan's 20th anniversary with the opening of its new, expanded offices in Taiwan as part of the Company's strategy to strengthen field operations and local training capabilities. Nova's President and CEO, Eitan Oppenhaim, attended the opening of the new offices in Hsinchu City and christened the new...
Read More »Nova and GLOBALFOUNDRIES Jointly Awarded the Best Metrology Paper at SPIE Advanced Lithography Conference
Demonstrating adaptive metrology capabilities using machine learning engines REHOVOT, Israel, Feb. 27, 2019 /PRNewswire/ --Nova (NASDAQ: NVMI) today announced that its co-authored paper with GLOBALFOUNDRIES on 'Implementation of machine learning for high volume manufacturing metrology challenges' has been selected as the winner of the Diana Nyyssonen award for 'best paper at SPIE's 2018...
Read More »Nova Completes the Acquisition of ReVera
Acquisition adds advanced X-Ray solutions to the portfolio and strengthens Nova's strategic position in the advanced process control market REHOVOT, Israel –Ã- Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today announced it has closed the previously...
Read More »Nova to Acquire ReVera, Provider of Advanced X-Ray Metrology Solutions, to Strengthen Position in Advanced Process Control Market
Acquisition expected to be accretive to non-GAAP EPS and provide differentiated portfolio for meeting customers' challenging wafer fabrication processes REHOVOT, Israel Conference Call at 10 a.m. ET on March 12, 2015 Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor...
Read More »Nova Measuring Instruments to Open NASDAQ and Hold Analyst Event in New York on January 10, 2011
Opening-Bell Ceremony at 9:30am Followed by an Analyst Brunch at 10:30am REHOVOT, Israel, December 16, 2010 - Nova Measuring Instruments Ltd. (NASDAQ: NVMI), provider of leading-edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that its CEO, Mr. Gabi Seligsohn and its Chairman of the Board of Directors,...
Read More »Nova Measuring Instruments to Present at the Needham Conference in New York on January 11, 2011
Company Presentation Will be at 10:40am and Will be Webcast Live REHOVOT, Israel, December 15, 2010 - Nova Measuring Instruments Ltd. (NASDAQ: NVMI), provider of leading-edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that its Chief Executive Officer, Mr. Gabi Seligsohn, and Chief Financial Officer,...
Read More »Nova Extends Its Leadership of the Copper CMP Process Control Market
Another Top Tier Foundry Adopts Nova's Integrated Metrology Solution REHOVOT, Israel, December 6, 2010 - Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that an additional top tier foundry has decided to adopt its integrated metrology...
Read More »Nova to Present at the Annual Rodman & Renshaw Global Investment Conference in New York
REHOVOT, Israel, September 1, 2010 - Nova Measuring Instruments Ltd. (NASDAQ: NVMI), provider of leading-edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, announced that its Chief Executive Officer, Mr. Gabi Seligsohn and its Chief Financial Officer, Mr. Dror David, will present at the Annual Rodman & Renshaw Global...
Read More »Metrology System meets requirements of IC manufacturing.
Identifying changes and irregularities in film microstructure, Crystalx II(TM) wide angle X-ray diffraction metrology system provides quick quantitative full wafer measurements of crystallographic texture, phase, and relative grain size. Suitable for process development and production, monitoring tool uses 2D area detector for collection of multiple diffraction peaks at multiple angles...
Read More »Nova Measuring Instruments Announces New Management Team
REHOVOTH, Israel, November 6--Nova Measuring Instruments, Ltd. (Nasdaq: NVMI), the market leader in integrated metrology and process control for the semiconductor industry, today announced changes to its management team in support of a new business unit structure that better aligns and balances management skills, organizes the company along profit center lines, and integrates the operations of...
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