Asylum Research

Oak Ridge National Laboratory and Asylum Research Receive Microscopy Today Innovation Award for New Band Excitation SPM Technology
Optics & Photonics

Oak Ridge National Laboratory and Asylum Research Receive Microscopy Today Innovation Award for New Band Excitation SPM Technology

(Santa Barbara, CA): Asylum Research, the technology leader in scanning probe and atomic force microscopy, and Oak Ridge National Laboratory (ORNL) have just received the prestigious Microscopy Today Innovation Award for the development of Band Excitation (BE), a new breakthrough scanning probe microscopy (SPM) technology. Band excitation allows more rapid probing of energy dissipation at the...

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Ztherm(TM) Modulated Thermal Analysis Wins 2010 R&D100 Award
Laboratory and Research Supplies and Equipment

Ztherm(TM) Modulated Thermal Analysis Wins 2010 R&D100 Award

July 13, 2010 (Santa Barbara, CA): Asylum Research, Oak Ridge National Laboratory (ORNL), and R&D Magazine have announced that the new Ztherm Modulated Local Thermal Analysis Option for Asylum's MFP-3D(TM) and Cypher(TM) Atomic Force Microscopes (AFMs) has been awarded the R&D100 Award for 2010. Ztherm provides highly localized heating with sensitivity to ≤10-22 liter (sub-zeptoliter) materials...

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Asylum Research Installs First Cypher AFM in Mexico - AFM Seminar at ININ July 19-22
Optics & Photonics

Asylum Research Installs First Cypher AFM in Mexico - AFM Seminar at ININ July 19-22

(Santa Barbara, CA), Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), announces that it has installed the first Cypher AFM in Mexico at the Instituto Nacional de Investigaciones Nucleares (ININ) facility in Salazar. The system was installed by personnel from Micra Nanotecnologia and Asylum Research in the lab of Dr. Manuel Espinosa at ININ. Dr....

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AFMs come with modulated local thermal analysis option.
Optics & Photonics

AFMs come with modulated local thermal analysis option.

MFP-3D(TM) and Cypher(TM) AFMs feature Ztherm option, which provides localized heating with sensitivity to less than or equal to 10-22 L materials property changes. Ztherm package can also be used to evaluate contact stiffness and dissipation as function of temperature with advanced techniques such Dual AC Resonance Tracking (DART). Integrated piezo actuation allows high resolution AC imaging of...

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Atomic Force Microscope offers cooling/heating capabilities.
Optics & Photonics

Atomic Force Microscope offers cooling/heating capabilities.

Designed for MFP-3D Atomic Force Microscope, CoolerHeater Accessory uses Peltier element to cool samples down to -35°C and heat samples up to +120°C. Unit can be sealed for use in air or in controlled gaseous environment. Accessory is suited for studying temperature-dependent phenomena like phase transitions and chemical reactions, as well as for investigating dependence of...

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Asylum Research's MFP NanoIndenter Wins AVS Product Award
Machinery & Machining Tools

Asylum Research's MFP NanoIndenter Wins AVS Product Award

January 8, 2009 (Santa Barbara, CA): AVS and Asylum Research have announced that Asylum's MFP-3D(TM) NanoIndenter has been selected as one of the top five products exhibited at the AVS International Symposium in October. Asylum's MFP NanoIndenter is a true "instrumented" indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These...

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AFM includes SpotOn(TM) automated laser alignment capability.
Optics & Photonics

AFM includes SpotOn(TM) automated laser alignment capability.

Achieving closed loop atomic resolution using sensors in all 3 axes, Cypher(TM) AFM includes integrated enclosure which provides acoustic and vibration isolation, as well as thermal control for image and measurement stability. Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3 Â-µm for broad application and scan mode flexibility, as...

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Optics & Photonics

Microscope takes nanoscale electromechanical measurements.

MFP-3D(TM) Atomic Force Microscope is available with Piezo Force Module, which enables crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. Through imaging modes, dual frequency resonance tracking, and band excitation, module effectively uses resonance enhancement in piezoresponse force microscopy (PFM) and provides information on local response...

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Atomic Force Microscope uses nanoindenter module.
Optics & Photonics

Atomic Force Microscope uses nanoindenter module.

Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and...

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