Company News

Asylum Research

6310 Hollister Ave., Santa Barbara, CA, 93117, USA

  • 888-472-2795

Latest New Product News from
Asylum Research

Laboratory and Research Supplies and Equipment, Optics & Photonics

Electrochemistry Cell offers compatibility with glovebox.

Nov 21, 2016

Designed for easy assemble and disassemble, Electrochemistry Cell supports wide range of working electrode materials and sizes for multitude environmental conditions. Allowing simultaneous electrochemistry and heating/cooling, unit can be used with any potentiostat. Providing compatibility with conventional and cutting edge electrolytes, device is suitable for studying electrochemical... Read More

Optics & Photonics

Atomic Force Microscopes sense both resistance and capacitance.

Jan 27, 2014

Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs. Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including... Read More

Electrical Equipment & Systems, Optics & Photonics

Atomic Force Microscopes offer photothermal excitation.

Nov 18, 2013

Available exclusively for Cypher™ AFMs, blueDrive Photothermal Excitation option makes tapping mode imaging stable and accurate. Feature uses blue laser to directly excite AFM cantilever photothermally, replacing conventional piezoacoustic excitation mechanism. blueDrive  is compatible with full range of tapping mode techniques in air and liquid including topographic imaging, phase imaging,... Read More

Optics & Photonics

Atomic Force Microscopes offer Contact Resonance mode.

Sep 20, 2013

Available exclusively for Cypher™ and MFP-3D™ Atomic Force Microscopes, Contact Resonance Viscoelastic Mapping Mode enables high-resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus. Technique is particularly well-suited for characterizing moderate to high modulus materials in range of 1–200 GPa, such as composites, thin films, biomaterials, polymer... Read More

Optics & Photonics, Software, Test & Measuring Instruments

AFM Probes offer automated calibration.

Sep 06, 2013

Supplied with MFP-3D™ and Cypher™ atomic force microscope probes, GetReal™ Automated Probe Calibration feature fully calibrates probe sensitivity and spring constant, enabling consistent, accurate results. Based on thermal noise method and Sader method, non-contact calibration also protects probe from damage that occurs with conventional calibration methods, preserving sharpest tip for... Read More

Optics & Photonics

Atomic Force Microscope offers several operational modes.

May 17, 2013

Delivering closed-loop precision, Hi-Res imaging, and low-noise force measurements, MFP-3D Origin™ offers basic scan modes as well as nanolithography, Dual AC™, and piezoresponse force microscopy modes. Additional functionality may be added for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunneling microscopy, and scanning thermal... Read More

Material Handling & Storage, Optics & Photonics

Magnetic Field Module is used with atomic force microscopes.

Nov 11, 2011

Designed to attach to MFP-3D Atomic Force Microscopes (AFMs), Variable Field Module2 (VFM2(TM)) applies continuously adjustable magnetic fields parallel to sample plane approaching one Tesla with one Gauss resolution. Adjustable pole tips allow choice between max required field, sample placement, and min field gradients; field intensity is software controllable; and integrated Gaussmeter provides... Read More

Optics & Photonics

AFMs come with modulated local thermal analysis option.

Jun 19, 2009

MFP-3D(TM) and Cypher(TM) AFMs feature Ztherm option, which provides localized heating with sensitivity to less than or equal to 10-22 L materials property changes. Ztherm package can also be used to evaluate contact stiffness and dissipation as function of temperature with advanced techniques such Dual AC Resonance Tracking (DART). Integrated piezo actuation allows high resolution AC imaging of... Read More

Optics & Photonics

Atomic Force Microscope offers cooling/heating capabilities.

May 18, 2009

Designed for MFP-3D Atomic Force Microscope, CoolerHeater Accessory uses Peltier element to cool samples down to -35°C and heat samples up to +120°C. Unit can be sealed for use in air or in controlled gaseous environment. Accessory is suited for studying temperature-dependent phenomena like phase transitions and chemical reactions, as well as for investigating dependence of mechanical,... Read More

Optics & Photonics

AFM includes SpotOn(TM) automated laser alignment capability.

Nov 20, 2008

Achieving closed loop atomic resolution using sensors in all 3 axes, Cypher(TM) AFM includes integrated enclosure which provides acoustic and vibration isolation, as well as thermal control for image and measurement stability. Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3 µm for broad application and scan mode flexibility, as well as... Read More

Optics & Photonics

Microscope takes nanoscale electromechanical measurements.

Dec 06, 2007

MFP-3D(TM) Atomic Force Microscope is available with Piezo Force Module, which enables crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. Through imaging modes, dual frequency resonance tracking, and band excitation, module effectively uses resonance enhancement in piezoresponse force microscopy (PFM) and provides information on local response... Read More

Optics & Photonics

Atomic Force Microscope uses nanoindenter module.

Aug 23, 2006

Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and... Read More

Optics & Photonics

Module aids in taking conductive AFM measurements.

Jun 07, 2004

Working with MFP-3D(TM) AFM System, ORCA(TM) enables current measurements in range of hundreds of femtoamps to nearly 1 microamp. Module consists of cantilever holder that includes transimpedance amplifier. User can choose gain of amplifier, and standard values range from 5 x 107 to 5 x 109 V/A. Module is suited for characterizing dielectric and ferro-electric films, nanotubes, or conductive... Read More

Computer Hardware & Peripherals, Printing & Duplicating Equipment

AFM System offers nanolithography and manipulation feature.

Nov 12, 2002

MFP-3D® AFM System consists of digital controller, Igor Pro software, and Nanopositioning system. With MicroAngelo feature, system allows nanolithography images to be imported from other programs or generated within software environment. Imported images are converted into series of contour lines which are then scaled and used to drive scanner to create lithographic image. Sensored, closed loop... Read More

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Asylum Research