FEI Co.

Optics & Photonics

First Titan(TM) S/TEM Installed in Sweden

November 15, 2007/Hillsboro, Ore.-Chalmers University of Technology in Goteborg, Sweden is the first institute in that country to have installed an FEI (Nasdaq: FEIC) Titan(TM) scanning/transmission election microscope (S/TEM), the world's most powerful commercially-available microscope. The university's inauguration of the advance instrument was marked by a special dedication ceremony and a...

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S/TEM System offers sub-Angstrom imaging capabilities.
Optics & Photonics

S/TEM System offers sub-Angstrom imaging capabilities.

Featuring fully enclosed profile, TitanÂ-³(TM) 80-300 combines 2 Cs-aberration correctors and monochromator on single instrument. Scientists can study how atoms combine to form materials, how materials grow, and how they respond to variety of external factors. Equipped with digital remote control interface, system operates from 80-300 kV, providing optimized imaging of wide variety of...

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Optics & Photonics

Team Project Achieves Microscopy Breakthrough

0.5 Angstrom Imaging Milestone Reveals the Smallest Details Ever Seen by Electron Microscopy HILLSBORO, Ore./September 6, 2007 The highest-resolution images ever seen in (S)TEM electron microscopy have been recorded using a new instrument developed jointly by U.S. Department of Energy national laboratories, FEI Company (Nasdaq: FEIC) and CEOS GmbH, in Heidelberg, Germany. This breakthrough in...

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Optics & Photonics

Scanning Electron Microscope handles broad range of samples.

Nova NanoSEM(TM) 30 Series SEM enables surface characterization and analysis of samples such as nanoparticles, insulating substrates, porous materials, metals, and composites. It provides prototyping capabilities based on electron beam lithography, electron beam induced deposition, and in-situ experimentation for manipulation and testing. Models 230 and 430 feature 50 x 50 mm and 100 x 100 mm...

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Cryogenic Freezing Tool features touchscreen user interface.

Vitrobot Mark IV cryo sample preparation tool physically fixates biological structures within ultrathin vitrified ice layers so samples can withstand high voltages such as those used in 3-dimensional transmission electron microscopy. Features include Linux operated touchscreen interface and robotics, and automated vitrification medium to liquid nitrogen atmosphere transfer.

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Software

Software System provides SEM and EDS validation.

Suited for forensics and mining applications, microValidator(TM) provides automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing accuracy, traceability, and reproducibility of results. Package includes software, beam current meter, and sub-stage mount containing essential standards. Offering SEM, EDS, and combined SEM/EDS checks, system...

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Optics & Photonics

Microscope bridges optical and scanning electron microscopy.

Facilitating operation via interactive touchscreen, Phenom(TM) can be used in most locations and does not require specialized facilities. Solution yields magnification up to 20,000x in compact design to bring high-resolution imaging to industrial as well as academic applications. Example areas of use include quality assurance, product development, research, and teaching.

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Optics & Photonics

High Resolution Microscope magnifies up to 20,000x.

Phenom(TM) high-resolution imaging microscope features performance levels between those of optical and scanning electron microscopes. Capable of yielding magnification up to 20,000x, unit features interactive touch screen user interface. Suitable applications include quality assurance, product development, research, and teaching. Unit is portable and requires no specialized facilities.

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Circuit Edit/Validation System uses ion column technology.
Test & Measurement

Circuit Edit/Validation System uses ion column technology.

Offering circuit edit capabilities, V600CE accelerates semiconductor design validation and performance optimization on 65 nm and below devices. Etching planarity is promoted with NanoChemix(TM) tri-nozzle gas delivery system, which accommodates range of precursors for etching and deposition. Dynamic end-point solution displays live imaging of active pattern as well as both stage current readings...

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Optics & Photonics

STEM System analyzes multiple wafer samples.

Designed for semiconductor labs, Expida(TM) 1255S DualBeam(TM) System integrates STEM Scanning/Transmission Electron Microscopy sample preparation with high-resolution imaging and analysis in single tool. It features ion beam column for preparing TEM samples, and electron column with 14-segment STEM detector for 30 kV imaging. System assures correct end-pointing and precise lamella thickness by...

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