FEI Co.

FEI Wins Multi-System Order from CANMET Materials Technology Laboratory
Laboratory and Research Supplies and Equipment

FEI Wins Multi-System Order from CANMET Materials Technology Laboratory

Federally-funded research center selects the Tecnai Osiris TEM, Helios NanoLab DualBeam and Nova NanoSEM as part of a competitive evaluation Hillsboro, Ore. ― FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications in research and industry, today announced that the CANMET Materials Technology Laboratory (CANMET-MTL), a research center...

Read More »
High-Resolution Scanning Electron Microscope suits life sciences.
Optics & Photonics

High-Resolution Scanning Electron Microscope suits life sciences.

Magellan(TM) extreme resolution scanning electron microscope (SEM), for life science imaging, allows users to view entire organization of cell in its natural, fully-hydrated state. Featuring cryogenic sample preparation and handling, device is able to vitrify and transfer samples to vacuum chamber in same unit. It provides high-throughput, sub-nanometer resolution, even at voltages below 1-30 kV,...

Read More »
Optics & Photonics

FEI and Nanonics Enter into Collaborative Agreement

Companies explore potential development and market opportunities for hybrid AFM/DualBeam system. Hillsboro, Ore. ―FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications across many industries, announces that it has entered into an agreement to collaborate with Nanonics Imaging Ltd., based in Israel, to explore the feasibility of...

Read More »
Optics & Photonics

Scanning Electron Microscopes offer nanometer-scale resolution.

Equipped with 16-bit scan engine, Nova(TM) NanoSEM 50 Series uses retractable and in-lens detectors for SE, BSE, and STEM signal collection and filtering. Nova NanoSEM 450, featuring 110 mm stage with up to 75° motorized tilt, is suited for advanced material science applications. Equipped with 150 mm piezo-electric stage, Nova NanoSEM 650 provides 100% coverage of 6 in. wafers or masks....

Read More »
Optics & Photonics

FEI Commissions Titan S/TEM at Institute of Nanoscience of Aragon

World class research institute will use world's most powerful commercially-available microscope to investigate new materials and structures down to the atomic scale. Hillsboro, Ore./- FEI Company (NASDAQ: FEIC), a leading scientific instrumentation company providing electron microscopy systems for nanoscale applications across many industries, has successfully completed the installation of its...

Read More »
Materials Characterization System offers 3D imaging, milling.
Optics & Photonics

Materials Characterization System offers 3D imaging, milling.

Helios NanoLab(TM) x50 DualBeam(TM) Series includes Helios 650, for academic and industrial research centers, and Helios 450(S) series for advanced semiconductor labs. Devices integrate high-resolution scanning electron microscope and focused ion beam (FIB) that optimizes imaging/milling and speeds material removal on large structures. High-quality 3D data helps understand material...

Read More »
Optics & Photonics

Direct Electron Detector handles beam-sensitive materials.

Designed for Titan(TM) and Tecnai(TM) transmission electron microscopes, Falcon(TM) Direct Electron Detector enables acquisition of low-noise images of delicate biological samples and other beam-sensitive materials that require low electron dose interactions to prevent radiation damage of material. Offering 4 K x 4 K resolution, detector allows life scientists to see biologically significant...

Read More »
Electron Microscope targets semiconductor manufacturing.
Optics & Photonics

Electron Microscope targets semiconductor manufacturing.

Suited for high-volume industrial and multi-user research laboratories, 200 kV Tecnai Osiris(TM) scanning/transmission electron microscope features ChemiSTEM technology, which minimizes time required for large field-of-view energy dispersive x-ray elemental mapping. Microscope also includes MultiLoader(TM) sample handling to minimize thermal equilibration time after sample exchanges, FS-1...

Read More »
Microscopy System analyzes full wafers up to 300 mm.
Optics & Photonics

Microscopy System analyzes full wafers up to 300 mm.

Helios 1200 Full Wafer DualBeam(TM) System accelerates time to data for failure analysis, process development, and process control in semiconductor and data storage manufacturing. System combines scanning electron microscope image resolution and fast switching between imaging and ion beam milling to deliver cross-sectional analysis of structures and defects. Included iFAST automation software...

Read More »
Automated System measures micro- and nano-fibers.
Optics & Photonics

Automated System measures micro- and nano-fibers.

Powered by Phenom(TM) personal electron microscope, Fibermetric(TM) System discovers and quantifies properties of woven and nonwoven fiber samples in minutes. System automatically collects hundreds of measurements per image, and generates fiber and pore size distribution plots for quality control and for predicting application properties such as filtration efficiency. Magnifications up to 24,000...

Read More »

All Topics

COVID-19 Response Suppliers COVID-19 Response:
Can Your Company Help Provide Critical Supplies?

We are using the power of our platform to aid in the mass shortage of critical supplies. If your company can help provide supplies, capabilities, or materials for products such as N-95 Masks and Tyvek SuitsPlease let us know.

COVID-19 Response Suppliers