FEI Co.
Hillsboro, OR 97124
Monash University Orders High-End Transmission Electron Microscope from FEI for Integrated Structural Biology
World-class research facility will integrate cryo-EM with X-ray diffraction, nuclear magnetic resonance, synchrotron-based approaches and computational techniques to determine atomic structure and functional mechanisms of medically-important protein complexes. Hillsboro, Ore. –- FEI (NASDAQ: FEIC) today announced that Monash University, a world-leading research facility in Melbourne,...
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Monash University Orders High-End Transmission Electron Microscope from FEI for Integrated Structural Biology
World-class research facility will integrate cryo-EM with X-ray diffraction, nuclear magnetic resonance, synchrotron-based approaches and computational techniques to determine atomic structure and functional mechanisms of medically-important protein complexes. Hillsboro, Ore. –Ã- FEI (NASDAQ: FEIC) today announced that Monash University, a world-leading research facility in Melbourne,...
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FEI Revolutionizes the World of TEM with the Introduction of Three New Systems
The new TEM systems continue FEI's emphasis on technology leadership while redefining its product portfolio for efficient and effective application-specific workflows Hillsboro, Ore. — FEI (NASDAQ: FEIC) today introduced three new systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The new systems launched today provide efficient...
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FEI Revolutionizes the World of TEM with the Introduction of Three New Systems
The new TEM systems continue FEI's emphasis on technology leadership while redefining its product portfolio for efficient and effective application-specific workflows Hillsboro, Ore. — FEI (NASDAQ: FEIC) today introduced three new systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The new systems launched today provide efficient...
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FIB/SEM Systems facilitate imaging of challenging materials.
DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for- investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem™ gas...
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FIB/SEM Systems facilitate imaging of challenging materials.
DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited forÃ- investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned forÃÂ accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam,ÃÂ with itsÃÂ patterning engine,...
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FIB SEM System investigates materials at nanometer scale.
Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically...
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FIB SEM System investigates materials at nanometer scale.
Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically...
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Wafer Analysis System quickly diagnoses root cause of defects.
With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in...
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Wafer Analysis System quickly diagnoses root cause of defects.
With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in...
Read More »