FEI Co.

Correlative Workflow Software aids cellular biology research.
Software

Correlative Workflow Software aids cellular biology research.

Combining light and electron microscopy, MAPS Modular Automated Processing System lets researchers see large scale context and small scale detail in one overview. Researchers can navigate to region of interest identified in light image, bringing to bear full resolving power of electron microscope to reveal ultrastructural detail. MAPS also enables assembly of large-field images by acquiring grid...

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Optics & Photonics

FEI, OHSU Partner to Create a 'Living Lab for Cell Biology' with High-Performance Electron Microscopes for Disease Research

Among the goals of the scientific collaboration is to advance cancer research and foster next-generation research tools PORTLAND, Ore. - FEI (NASDAQ: FEIC) and Oregon Health & Science University (OHSU) today announced a partnership to create the OHSU/FEI Living Lab for Cell Biology that will provide researchers with several state-of-the-art electron microscopes to advance the understanding and...

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S/TEM Microscope offers 3D analytical capabilities.
Optics & Photonics

S/TEM Microscope offers 3D analytical capabilities.

Combining electron optics with analytical sensitivity of ChemiSTEM Technology, Titan(TM) G2 80-200 provides atomic resolution elemental mapping over entire accelerating voltage range of 200-80 kV. System includes X-FEG high brightness gun and DCOR probe corrector, achieving spatial resolution of 0.8 Angstroms in STEM and 0.9 Angstroms in TEM. Large tilt-range, when combined with ChemiSTEM's...

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3D Imaging/Analysis System is highly configurable.
Optics & Photonics

3D Imaging/Analysis System is highly configurable.

Capable of providing high resolution, 3D imaging and analysis on range of sample types, Versa 3D(TM) DualBeam(TM) system lets users adapt capabilities to specific requirements. Configurable platform, available with high-vacuum only or high- and low-vacuum electron imaging hardware, combines Schottky field emission electron beam and high-throughput ion beam technologies. It may also be configured...

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Plasma Focused Ion Beam System targets advanced IC packaging.
Electronic Components & Devices

Plasma Focused Ion Beam System targets advanced IC packaging.

Vion(TM) plasma focused ion beam system is used in advanced integrated circuit (IC) packaging applications that use larger scale structures to connect multiple chips in tightly integrated packages. System quickly delivers site-specific cross-sectional analysis to accelerate failure analysis of bumps, wire bonds, through silicon vias (TSVs), and stacked die; as well as site specific removal of...

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Laboratory and Research Supplies and Equipment

FEI Provides 3D Analysis System to Whiting Oil and Gas Corporation

Hillsboro, Ore. and Denver, Colo. - FEI (NASDAQ: FEIC) and Whiting Oil and Gas Corporation, announce the purchase of QEMSCAN® automated petrography and Helios NanoLab(TM) DualBeam(TM) technology for Whiting's new rock lab in its Denver, Colorado headquarters. QEMSCAN provides data for reservoir characterization, including quantitative compositional and elastic properties critical for...

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Explosives, Armaments, and Weaponry

FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center

Systems will be used to create, and even manipulate, new materials, devices and systems at the nanoscale Hillsboro, Ore., USA and San Sebastian, Spain- FEI Company (NASDAQ: FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research Center, nanoGUNE Consolider, are pleased to announce the installation of three new advanced electron microscope systems from...

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FEI Hits Production Milestone for Helios NanoLab DualBeam
Optics & Photonics

FEI Hits Production Milestone for Helios NanoLab DualBeam

Ships 250th system as a result of expanded market adoption across a wide range of industries Hillsboro, Ore.- FEI (NASDAQ: FEIC), a leading instrumentation company that provides microscopy systems for research and industry, today announces that it has shipped the 250th Helios NanoLab(TM) DualBeam(TM) system. Since its introduction in 2006, the award-winning Helios NanoLab has experienced...

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Optics & Photonics

FEI and CEA-Leti Enter Joint Agreement to Characterize Advanced Semiconductor Materials

CEA-Leti and FEI expect to address technical roadblocks faced by the industry in moving to 22nm IC devices Hillsboro, Ore. and Grenoble, France-FEI (NASDAQ: FEIC) and CEA-Leti today announced the companies have entered into a three year agreement to characterize advanced semiconductor materials for the 22nm technology node and beyond. European-based CEA-Leti, with its two partners on the...

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Optics & Photonics

Scanning Electron Microscope analyzes gas reservoirs.

Combining scanning electron microscope and focused ion beam technologies with gas chemistries, detectors, and manipulators, Helios NanoLab(TM) DualBeam(TM) System analyzes production characteristics of unconventional gas reservoirs. System images kerogen, porosity, and microstructures in 3D with nanometer-scale resolution. Data are essential to determining potential of reservoir, optimizing...

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