FEI Co.

Monash University Orders High-End Transmission Electron Microscope from FEI for Integrated Structural Biology
Optics & Photonics

Monash University Orders High-End Transmission Electron Microscope from FEI for Integrated Structural Biology

World-class research facility will integrate cryo-EM with X-ray diffraction, nuclear magnetic resonance, synchrotron-based approaches and computational techniques to determine atomic structure and functional mechanisms of medically-important protein complexes. Hillsboro, Ore. –Â- FEI (NASDAQ: FEIC) today announced that Monash University, a world-leading research facility in Melbourne,...

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FEI Revolutionizes the World of TEM with the Introduction of Three New Systems
Optics & Photonics

FEI Revolutionizes the World of TEM with the Introduction of Three New Systems

The new TEM systems continue FEI's emphasis on technology leadership while redefining its product portfolio for efficient and effective application-specific workflows Hillsboro, Ore. — FEI (NASDAQ: FEIC) today introduced three new systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The new systems launched today provide efficient...

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FIB/SEM Systems facilitate imaging of challenging materials.
Optics & Photonics

FIB/SEM Systems facilitate imaging of challenging materials.

DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited forÂ- investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning...

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FIB SEM System investigates materials at nanometer scale.
Optics & Photonics

FIB SEM System investigates materials at nanometer scale.

Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically...

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Wafer Analysis System quickly diagnoses root cause of defects.
Optics & Photonics

Wafer Analysis System quickly diagnoses root cause of defects.

With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in...

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Health, Medical, & Dental Supplies and Equipment

FEI Achieves Milestone for Automated Mineralogy Products

Techniques have experienced wide-spread acceptance for their ability to deliver critical information to optimize exploration and production in mining and oil & gas industries Hillsboro, Ore.Â- – FEI (NASDAQ: FEIC) today announced that it has reached a milestone of more than 200 automated mineralogy systems installed worldwide. FEI's Mineral Liberation Analysis (MLA) and QEMSCAN®...

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Particulate Analyzer monitors automotive part cleanliness.
Laboratory and Research Supplies and Equipment

Particulate Analyzer monitors automotive part cleanliness.

Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis;...

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Transmission Electron Microscope aids structural biology research.
Optics & Photonics

Transmission Electron Microscope aids structural biology research.

Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up...

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FEI QEMSCAN WellSite Expands to Onsite Core Analysis with System Delivery to Kirk Petrophysics
Mining, Oil Drilling, Refining Products & Equipment

FEI QEMSCAN WellSite Expands to Onsite Core Analysis with System Delivery to Kirk Petrophysics

Advanced onsite core analysis provides fast support for critical decisions in formation evaluation and drilling operations. Hillsboro, Ore., USA and Surrey, U.K. - FEI (NASDAQ: FEIC) and Kirk Petrophysics (Surrey, U.K.) today announced that FEI has delivered a QEMSCAN® WellSite(TM) analysis system to Kirk Petrophysics who will use it to provide rapid onsite analysis of drill cores in oil...

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Dual Beam System provides semiconductor failure analysis.
Optics & Photonics

Dual Beam System provides semiconductor failure analysis.

CombiningÂ- scanning electron microscope for imaging and focused ion beam for milling and deposition, Helios NanoLab™ 450 F1 DualBeam™ System provides semiconductor manufacturers with optimal images of device architectures. STEM detector delivers material contrast, while FlipStage™ 3 flips sample between thinning and STEM viewing positions, and rotation axis permits viewing from either...

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