FEI Co.

Optics & Photonics

Russia Opens New Nanotech Center with FEI Tools

FEI Plays Key Role in Moscow's New Pilot Scientific and Technical Center of Excellence for Nanotechnology Development HILLSBORO, Ore. /June 5, 2006--FEI Company (Nasdaq: FEIC) today announced that three of its systems, including Tecnai(TM) T12 and T30 transmission electron microscopes (TEMs) and a Quanta(TM) 3D DualBeam(TM), have been selected as core enabling tools for Russia's new Pilot...

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Optics & Photonics

Russia Opens New Nanotech Center with FEI Tools

FEI Plays Key Role in Moscow's New Pilot Scientific and Technical Center of Excellence for Nanotechnology Development HILLSBORO, Ore. /June 5, 2006--FEI Company (Nasdaq: FEIC) today announced that three of its systems, including Tecnai(TM) T12 and T30 transmission electron microscopes (TEMs) and a Quanta(TM) 3D DualBeam(TM), have been selected as core enabling tools for Russia's new Pilot...

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Optics & Photonics

FEI's Titan(TM) S/TEM Installed at France's LETI

World's most powerful commercial microscope will aid world-class center and its partners in commercializing semiconductor processes below the 65nm design node HILLSBORO, Oregon/May 16, 2006-France's LETI (Laboratoire d'Electronique de Technologie de l'Information) has become one of the first European sites to install and begin using the world's highest-resolution, commercially-available...

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Optics & Photonics

FEI's Titan(TM) S/TEM Installed at France's LETI

World's most powerful commercial microscope will aid world-class center and its partners in commercializing semiconductor processes below the 65nm design node HILLSBORO, Oregon/May 16, 2006-France's LETI (Laboratoire d'Electronique de Technologie de l'Information) has become one of the first European sites to install and begin using the world's highest-resolution, commercially-available...

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Laboratory and Research Supplies and Equipment

Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis

FEI's DA300 HP DualBeam(TM) to be utilized for unique CCD application HILLSBORO, Ore./May 11, 2006--FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used...

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Laboratory and Research Supplies and Equipment

Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis

FEI's DA300 HP DualBeam(TM) to be utilized for unique CCD application HILLSBORO, Ore./May 11, 2006--FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used...

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Optics & Photonics

McMaster University Orders Two FEI Titan(TM) S/TEMs

Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ångstrom resolution-and a multi-year service contract to support them....

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Optics & Photonics

McMaster University Orders Two FEI Titan(TM) S/TEMs

Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ã…ngstrom resolution-and a multi-year service contract to support...

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Laboratory and Research Supplies and Equipment

FEI's Automated 3D Crystallography Featured at PITTCON

FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...

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Laboratory and Research Supplies and Equipment

FEI's Automated 3D Crystallography Featured at PITTCON

FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...

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