FEI Co.
Hillsboro, OR 97124
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Russia Opens New Nanotech Center with FEI Tools
FEI Plays Key Role in Moscow's New Pilot Scientific and Technical Center of Excellence for Nanotechnology Development HILLSBORO, Ore. /June 5, 2006--FEI Company (Nasdaq: FEIC) today announced that three of its systems, including Tecnai(TM) T12 and T30 transmission electron microscopes (TEMs) and a Quanta(TM) 3D DualBeam(TM), have been selected as core enabling tools for Russia's new Pilot...
Read More »Russia Opens New Nanotech Center with FEI Tools
FEI Plays Key Role in Moscow's New Pilot Scientific and Technical Center of Excellence for Nanotechnology Development HILLSBORO, Ore. /June 5, 2006--FEI Company (Nasdaq: FEIC) today announced that three of its systems, including Tecnai(TM) T12 and T30 transmission electron microscopes (TEMs) and a Quanta(TM) 3D DualBeam(TM), have been selected as core enabling tools for Russia's new Pilot...
Read More »FEI's Titan(TM) S/TEM Installed at France's LETI
World's most powerful commercial microscope will aid world-class center and its partners in commercializing semiconductor processes below the 65nm design node HILLSBORO, Oregon/May 16, 2006-France's LETI (Laboratoire d'Electronique de Technologie de l'Information) has become one of the first European sites to install and begin using the world's highest-resolution, commercially-available...
Read More »FEI's Titan(TM) S/TEM Installed at France's LETI
World's most powerful commercial microscope will aid world-class center and its partners in commercializing semiconductor processes below the 65nm design node HILLSBORO, Oregon/May 16, 2006-France's LETI (Laboratoire d'Electronique de Technologie de l'Information) has become one of the first European sites to install and begin using the world's highest-resolution, commercially-available...
Read More »Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis
FEI's DA300 HP DualBeam(TM) to be utilized for unique CCD application HILLSBORO, Ore./May 11, 2006--FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used...
Read More »Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis
FEI's DA300 HP DualBeam(TM) to be utilized for unique CCD application HILLSBORO, Ore./May 11, 2006--FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used...
Read More »McMaster University Orders Two FEI Titan(TM) S/TEMs
Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ångstrom resolution-and a multi-year service contract to support them....
Read More »McMaster University Orders Two FEI Titan(TM) S/TEMs
Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ãâ¦ngstrom resolution-and a multi-year service contract to support...
Read More »FEI's Automated 3D Crystallography Featured at PITTCON
FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...
Read More »FEI's Automated 3D Crystallography Featured at PITTCON
FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...
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